prof. Ing. Jaromír Pištora, CSc.

VŠB-TUO - Centrum nanotechnologií > O centru > Lidé > Pistora - prof. Ing. Jaromír Pištora, CSc.

  • Full Professor from Technical University of Ostrava in 1996 (prof.),
  • Associate Professor from Charles University in 1991 (doc.)
  • Ph.D. from Charles University in 1984 (CSc.)
  • MSc. in Electrical Engineering from Czech Technical University in 1977 (Ing.)

Reaserch

Researcher in optics and magnetism, focused on thin film optics, periodic structures, integrated optics, optical diffraction and scatterometry, and magnetic field sensors (activities: critical dimensions of spectral ellipsometry, spectral ellipsometry of periodic structures, MO-SPR sensors, magnetic field generators for magneto-optics, nonlinear optical effects, magneto-ellipsometry).

Educator in Physics, Electromagnetic Theory, Magnetic Sensors and Defectoscopes. Supervisor of MSc and PhD theses. Published more than 300 papers in international journals and conference proceedings including 12 invited talks. Member of IEEE, OSA, SPIE-Czech Chapter, Czech and Slovak Society for Photonics, Union of Czech Math. and Physicists, EOS-Czech Chapter. Visiting Professor at Kyushu University – 1999, 2001, Research Institute of Electronics, Shizuoka University – 2002, 2005-2006, Dalhousie University – 2007. Chairman of International Symposium on Microwave and Optical Technology (ISMOT), Ostrava 2003 and vicechairman of ISMOT 2005, Fukuoka, Japan.

List of publications (2004-2009)

  1. K. Postava, D. Hrabovský, O. Životský, J. Pištora, N. Dix, R. Muralidharan, J. M. Caicedo, F. Sánchez, J. Fontcuberta, Magneto-optic material selectivity in self-assembled BiFeO3 – CoFe2O4 biferroic nanostructures, Journal of Applied Physics 105, No. 7, 07C124 (2009). IF = 2.171
  2. M. Cada, M. Qasymeh, and J. Pištora, Electrically and optically controlled cross-polarized wave conversion, Opt. Express 16, 3083-3101 (2008). IF = 3.709, Cit.: 3
  3. M. Foldyna, K. Postava, D. Ciprian, J. Pištora, Modeling of magneto-optical properties of lamellar nanogratings, Journal of Alloys and Compounds 434-435, 581-584 (2007). IF = 1.455, Cit.: 3
  4. R. Antoš, J. Pištora, J. Mistrík, T. Yamaguchi, S. Yamaguchi, M. Horie, Š. Višňovský, and Y. Otani, Convergence properties of critical dimension measurements by spectroscopic ellipsometry on gratings made of various materials, J. Appl. Phys. 100, 054906 (2006). IF = 2.171, Cit.: 9
  5. K. Watanabe, J. Pištora, M. Foldyna, K. Postava, J. Vlček, Numerical study on the spectroscopic ellipsometry of lamellar gratings made of lossless dielectric materials, JOSA A 22, 745-748 (2005). IF = 1.776, Cit.: 2
  6. R. Antoš, J. Pištora, I. Ohlídal, K. Postava, J. Mistrík, T. Yamaguchi, Š. Višňovský, and M. Horie, Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate, J. Appl. Phys. 97, 053107 (2005). IF = 2.171, Cit.: 5
  7. J. Pištora, T. Yamaguchi, M. Foldyna, J. Mistrík, K. Postava, M. Aoyama, Magnetic sensor with prism coupler, Sensors & Actuators A 110, 88-93 (2004). IF = 1.348
  8. K. Postava, O. Životský, J. Pištora, T. Yamaguchi, Magneto-optical ellipsometry of systems containing thick layers. Thin Solid Films 455-456, 615-618 (2004). IF = 1.693, Cit.: 1


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