Course Unit Code | 9360-0160/01 |
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Number of ECTS Credits Allocated | 3 ECTS credits |
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Type of Course Unit * | Compulsory |
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Level of Course Unit * | Second Cycle |
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Year of Study * | First Year |
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Semester when the Course Unit is delivered | Winter Semester |
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Mode of Delivery | Face-to-face |
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Language of Instruction | Czech |
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Prerequisites and Co-Requisites | There are no prerequisites or co-requisites for this course unit |
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Name of Lecturer(s) | Personal ID | Name |
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| POS40 | doc. Dr. Mgr. Kamil Postava |
Summary |
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The main target of this subject is to understand fundamental principles of optical spectroscopy to characterize materials, thin films, nanostructured and periodic systems. Attention is devoted to methods and techniques of measurement, optical properties of materials, modeling of spectroscopic response and fitting of experimental spectroscopic data to a model. Applications of the spectroscopic methods in chemical analysis, characterization in material structure and properties are summarized. |
Learning Outcomes of the Course Unit |
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The main target of this subject is to understand fundamental principles of optical spectroscopy to characterize materials, thin films, nanostructured and periodic systems. Attention is devoted to methods and techniques of measurement, optical properties of materials, modeling of spectroscopic response and fitting of experimental spectroscopic data to a model. Applications of the spectroscopic methods in chemical analysis, characterization in material structure and properties are summarized. |
Course Contents |
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The subject deals with methods, physical description and appliications of optical spectroscopy. The lectures consists of:
1. Physical principles of optical spectroscopy, origin of spectral dependence of optical parameters, Kramers-Kronigovy relations and its application in spectroscopy.
2. Modeling of light propagation, reflection, transmission, and absorption spectra of materials, thin films, and nanostructures.
3. Dispersion elements, gratings, doispersion prism, interference methods in infrared spectroscopy, time-domain spectroscopy. Sources, detectors and materials used in spectrometers.
4. Spectroscopy in visible, near ultraviolet and near infrared spectral range (components of spectrometers, dual beam spectrometer, resolution).
5. Spectroscopic ellipsometry, ellipsometric angles, generalized and Mueller matrix ellipsometry, methods of data processing.
6. Spectroscopy in mid infrared spectral range (physical origin of infrared absorptions, vibration spectra, symmetry, Fourier transform infrared spectroscopy, apodization, ATR, IRRAS), Raman spektroscopy.
7. Magneto-optical spectroscopy (origin of magneto-optical effects, Kerr, Faraday, and Voight magneto=optic effects).
8. Origin of optical spectra from free charges, drude term, relation with electrical properties of materials. Debye model, absorption of polar liquids.
9. Model of damped harmonic oscillator, application for description of interband transitions and for vibration spectra in infrared spectroscopy.
10. Semiclasical theory of optical spectra of crystals, band structure, polycrystalline and amorphous materials, excitons.
11. Origin of infrared vibration and rotation spectra.
12. Models of nanostructured and nanokomposite materials. Application of effective medium theory, Maxwell-Garnet a Bruggeman formula. Description of periodic and aperiodic systems, plasmonics. |
Recommended or Required Reading |
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Required Reading: |
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HOLLAS, J. M., Modern Spectroscopy (4th ed.), John Willey & Sons, 2009.
FOX, M., Optical properties of solids, Oxford Univ. Press, 2003.
STENZEL, O., The physics of thin film optical spectra, Springer, Berlin, 2005.
PALIK, E. D., Handbook of optical constants of solids, Academic Press, New York, 1998.
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HOLLAS, J. M., Modern Spectroscopy (4th ed.), John Willey & Sons, 2009.
FOX, M., Optical properties of solids, Oxford Univ. Press, 2003.
STENZEL, O., The physics of thin film optical spectra, Springer, Berlin, 2005.
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Recommended Reading: |
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OHLÍDAL, I., FRANTA, D.: Ellipsometry of thin film systems, In: Progress in Optics, Vol. 41, Ed. E. Wolf, 2000.
ZVEZDIN, A. K., KOTOV, V. A.: Modern magnetooptics and magnetooptical materials, IOP, Bristol 1977.
HRING, M., The material science of thin films, Academic Press, 1992.
MACLEOD, H. A.: Thin-film optical filters, 2nd ed. Bristol, 1986.
YEH, P.: Optical waves in layered media, Willey, New York 1988.
LUTH, H., Solid surfaces, interfaces and thin films, Springer, Berlin 2001.
AZZAM, R. M. A., BASHARA, N. M.: Ellipsometry and polarized light, North-Holland, Amsterdam, 1977.
SVANBERG, S.: Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991. |
OHLÍDAL, I., FRANTA, D.: Ellipsometry of thin film systems, In: Progress in Optics, Vol. 41, Ed. E. Wolf, 2000.
LUTH, H., Solid surfaces, interfaces and thin films, Springer, Berlin 2001.
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Planned learning activities and teaching methods |
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Lectures |
Assesment methods and criteria |
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Task Title | Task Type | Maximum Number of Points (Act. for Subtasks) | Minimum Number of Points for Task Passing |
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Credit and Examination | Credit and Examination | 100 (100) | 51 |
Credit | Credit | 40 | 21 |
Examination | Examination | 60 | 30 |