Course Unit Code | 9360-0129/01 |
---|
Number of ECTS Credits Allocated | 4 ECTS credits |
---|
Type of Course Unit * | Compulsory |
---|
Level of Course Unit * | First Cycle |
---|
Year of Study * | Second Year |
---|
Semester when the Course Unit is delivered | Winter Semester |
---|
Mode of Delivery | Face-to-face |
---|
Language of Instruction | Czech |
---|
Prerequisites and Co-Requisites | Course succeeds to compulsory courses of previous semester |
---|
Name of Lecturer(s) | Personal ID | Name |
---|
| POS40 | doc. Dr. Mgr. Kamil Postava |
Summary |
---|
The main target of this subject is to introduce thin films as one-dimensional nanostructures. The lectures deals with technology of thin-film preparation, its characterization and description of optical, electrical, and magnetic properties of thin films. A stress is laid on summary of basic thin film applications. Students will be also informed about basic research directions at VSB-Technical University of Ostrava in the field of physics of thin films and nanostructures and available Bc. thesis. |
Learning Outcomes of the Course Unit |
---|
The main target of this subject is to introduce thin films as one-dimensional nanostructures. The lectures deals with technology of thin-film preparation, its characterization and description of optical, electrical, and magnetic properties of thin films. A stress is laid on summary of basic thin film applications. Students will be also informed about basic research directions at VSB-Technical University of Ostrava in the field of physics of thin films and nanostructures and available Bc. thesis. |
Course Contents |
---|
The lectures consists of:
1. Introduction to thin films as one-dimensional nanostructures
2. Vacuum systems used for preparation of thin films, requirements of reduced pressure, vacuum technology
3. Physical vapor deposition, evaporation, sputtering
4. Chemical methods for thin-film deposition, chemical vapor deposition, electrodeposition, atomic layer deposition
5. Growth mechanism of thin films, growth of self-assembled nanostructures, epitaxy
6. Summary of methods for determination of thickness, composition, and structure of thin films
7. Optics of thin films, introduction to interference phenomena
8. Application of optical thin films, , interference filters, antrireflection coating, 1D photonic crystals
9. Electric properties of thin films, measurement of thin film conductivity
10. Application of thin films in microelectronics, effects o interfaces
11. Introduction to magnetic properties of thin films
12. Application of magnetic thin films, magnetic recording and data storage |
Recommended or Required Reading |
---|
Required Reading: |
---|
OHRING, M., The material science of thin films, Academic Press, 1992.
MACLEOD, H. A.: Thin-film optical filters, 2nd ed. Bristol, 1986.
YEH, P.: Optical waves in layered media, Willey, New York 1988. |
OHRING, M., The material science of thin films, Academic Press, 1992.
MACLEOD, H. A.: Thin-film optical filters, 2nd ed. Bristol, 1986.
YEH, P.: Optical waves in layered media, Willey, New York 1988.
ECKERTOVÁ, L.: Fyzika tenkých vrstev, Populární přednášky o fyzice, sv. 21; KŘEPELKA, J.: Optika tenkých vrstev, UP Olomouc, 1993. |
Recommended Reading: |
---|
LUTH, H., Solid surfaces, interfaces and thin films, Springer, Berlin 2001.
AZZAM, R. M. A., BASHARA, N. M.: Ellipsometry and polarized light, North-Holland, Amsterdam, 1977. |
LUTH, H., Solid surfaces, interfaces and thin films, Springer, Berlin 2001.
AZZAM, R. M. A., BASHARA, N. M.: Ellipsometry and polarized light, North-Holland, Amsterdam, 1977. |
Planned learning activities and teaching methods |
---|
Lectures, Tutorials |
Assesment methods and criteria |
---|
Task Title | Task Type | Maximum Number of Points (Act. for Subtasks) | Minimum Number of Points for Task Passing |
---|
Credit and Examination | Credit and Examination | 100 (100) | 51 |
Credit | Credit | 40 | 20 |
Examination | Examination | 60 | 31 |