| Course Unit Code | 9360-0132/03 |
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| Number of ECTS Credits Allocated | 3 ECTS credits |
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| Type of Course Unit * | Compulsory |
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| Level of Course Unit * | First Cycle |
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| Year of Study * | Third Year |
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| Semester when the Course Unit is delivered | Summer Semester |
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| Mode of Delivery | Face-to-face |
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| Language of Instruction | Czech |
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| Prerequisites and Co-Requisites | Course succeeds to compulsory courses of previous semester |
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| Name of Lecturer(s) | Personal ID | Name |
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| MAM02 | doc. Mgr. Kateřina Mamulová Kutláková, Ph.D. |
| Summary |
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| Students will try different experimental techniques of nanomaterials study (SEM, EMA, AFM, XRD, chromatography, IR spectrometry, Raman spectrometry) in practice |
| Learning Outcomes of the Course Unit |
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| Students will try different experimental techniques of nanomaterials study (SEM, EMA, AFM, XRD, chromatography, IR spectrometry, Raman spectrometry) in practice. |
| Course Contents |
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1. Sample preparation for chromatography. Extraction, SPE, SPME, thermal dessorpion, headspace analysis.
2. Gas chromatography. Analysis of gas and BTEX, calibration, determination of basic parameters of separation.
3. Liquid chromatography. Analysis of anions. Calibration, determination of basic parameters of separation.
Dectors on the basis of mass spectrometry. determination of structural compound formula on the basis of mass spectrum.
5. Identifying of asbestos using SEM + EMA method:
a) analysis of morphology and chemical composition of asbestos and other fibrous materials
b) analysis of an unknown sample of fibrous material, confirm or refute the presence of asbestos
6. Measuring of topography of semiconductor grid sample
a) in contact mode
b) in semi contact mode
7. Powder X-ray diffraction:
a) measuring diffraction of powdered sample on the Si plate
b) evaluation of diffraction record, identifying of compounds
8. Thermal analysis, evaluation of TG and DTA curves.
9. Infrared spectrometry
10 Raman spectrometry. |
| Recommended or Required Reading |
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| Required Reading: |
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WATT, I,. M.: The principles and practice of electron microscopy. Cambridge University Press, 1997.
JENKINS, R., SNYDER, R. L. Introduction to X-ray Powder Diffractometry. J.Wiley & Sons, 1996.
BONNELL, D. editor: Scanning Probe Microscopy and Spectroscopy, Theory, Techniques and Applications. Wiley-VCH, 2001. |
WATT, I,. M. The principles and practice of electron microscopy. Cambridge University Press, 1997.
ŠÍCHOVÁ, H., VALVODA, V., ČAPKOVÁ, P. Rentgenografické praktikum. Praha: SPN, 1982.
VŮJTEK, M., KUBÍNEK, R., MAŠLÁŇ, M. Nanoskopie. Olomouc: Univerzita Palackého, 2012. ISBN 978-80-244-3102-4. |
| Recommended Reading: |
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KENKEL, John. Analytical Chemistry for Technicians. Boca Raton: CRC Press, 2002. ISBN 978-1-4398-8105-7.
YAO, N., WANG, Z., L. (editors). Handbook of Microscopy for Nanotechnology. Kluwer Academic Publishers, 2005. |
KRAUS, I. Difrakční metody ve fyzice pevných látek. Praha: Ediční středisko ČVUT, 1984.
VALVODA, V. Rentgenografické difrakční metody. Praha: SPN Praha, 1979.
JENKINS, R., SNYDER, R. L. Introduction to X-ray Powder Diffractometry. Wiley & Sons, 1996.
JANDOŠ, František, Ríša ŘÍMAN a Antonín GEMPERLE. Využití moderních laboratorních metod v metalografii. Praha: SNTL, 1985.
BONNELL, D. editor: Scanning Probe Microscopy and Spectroscopy, Theory, Techniques and Applications. Wiley-VCH, 2001.
KUBÍNEK, R., VŮJTEK, M., MAŠLÁŇ, M. Mikroskopie skenující sondou. Olomouc: Univerzita Palackého, 20003. ISBN 80-244-0602-0. |
| Planned learning activities and teaching methods |
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| Seminars, Experimental work in labs |
| Assesment methods and criteria |
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| Task Title | Task Type | Maximum Number of Points
(Act. for Subtasks) | Minimum Number of Points for Task Passing |
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| Graded credit | Graded credit | 100 | 51 |