| Course Unit Code | 9360-0140/03 |
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| Number of ECTS Credits Allocated | 4 ECTS credits |
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| Type of Course Unit * | Compulsory |
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| Level of Course Unit * | Second Cycle |
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| Year of Study * | First Year |
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| Semester when the Course Unit is delivered | Winter Semester |
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| Mode of Delivery | Face-to-face |
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| Language of Instruction | Czech |
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| Prerequisites and Co-Requisites | There are no prerequisites or co-requisites for this course unit |
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| Name of Lecturer(s) | Personal ID | Name |
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| MAM02 | doc. Mgr. Kateřina Mamulová Kutláková, Ph.D. |
| Summary |
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| Crystallochemistry and structures in solids. Structures of crystallic, amorphous and mesomorphous phases. Modern methods of solid state characterisation. In materials research, the scientist has many analytical questions related to the crystalline constitution of material samples. X-ray diffraction is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use X-ray diffraction to analyze a wide range of materials, from powders and thin films to nanomaterials and solid objects. |
| Learning Outcomes of the Course Unit |
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| The use of diffraction methods (X-ray, electron, neutron, synchrotron radiation) for structure and phase analysis of nanomaterials. |
| Course Contents |
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1. Introduction- history, basic terms. Definition of crystal, lattice types, Miller indexes, crystallographic systems, minimal symmetry rules, reciprocal lattice.
2. Point symmetry, stereographic projection.
3. Group theory, crystallographic group of symmetry, symbols.
4. Matrix representation of symmetry operations.
5. Space group of symmetry, symbols, graphical illustration.
6. Crystallochemistry, crystallization processes, types of structure defects, crystal structure and chemical bond.
7. Ionic crystals. Molecules and molecular crystals. Physical properties of crystals.
8. X-ray. Principle, formation, forms, properties, registration, interaction with matter.
9. Diffraction of X-rays. Laue and Bragg equations. Structural factor.
10. X-ray diffraction methods, classification based on the Ewald construction, Laue, Debye Scherrer, powder methods.
11. Powder diffractometers, indexation of powder patterns records, focusing methods, practical applications of powder methods.
12. Monocrystallic diffraction methods.
13. Single crystal techniques. Weissenberg and precession method, types of diffractometers, complete X-ray analysis of crystal compounds.
14. Rietveld method of quantitative phase analysis and its practical usage. |
| Recommended or Required Reading |
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| Required Reading: |
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DE GRAEF, Marc a Michael E MCHENRY. Structure of materials: an introduction to crystallography, diffraction and symmetry. 2nd ed., fully rev. and updated. New York: Cambridge University Press, 2012. ISBN 978-1-107-00587-7.
CHUNG, Frank H a Deane Kingsley SMITH, ed. Industrial applications of X-ray diffraction. New York: Marcel Dekker, c2000. ISBN 0-8247-1992-1.
GIACOVAZZO, Carmelo. Fundamentals of crystallography. Oxford: Oxford University Press, c1992. ISBN 0-19-855579-2.
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ČECH BARABASZOVÁ, Karla. Vybrané instrumentální metody analýzy materiálů a nanomateriálů. Brno: Akademické nakladatelství CERM, 2012. ISBN 978-80-7204-810-6.
DE GRAEF, Marc a Michael E MCHENRY. Structure of materials: an introduction to crystallography, diffraction and symmetry. 2nd ed., fully rev. and updated. New York: Cambridge University Press, 2012. ISBN 978-1-107-00587-7.
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| Recommended Reading: |
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| GLUSKER, Jenny Pickworth a Kenneth N TRUEBLOOD. Crystal structure analysis: a primer. 2nd ed. New York: Oxford University Press, 1985. ISBN 0-19-503531-3. |
| CHUNG, Frank H a Deane Kingsley SMITH, ed. Industrial applications of X-ray diffraction. New York: Marcel Dekker, c2000. ISBN 0-8247-1992-1. |
| Planned learning activities and teaching methods |
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| Lectures, Individual consultations, Experimental work in labs |
| Assesment methods and criteria |
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| Task Title | Task Type | Maximum Number of Points
(Act. for Subtasks) | Minimum Number of Points for Task Passing |
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| Credit and Examination | Credit and Examination | 100 (100) | 51 |
| Credit | Credit | | |
| Examination | Examination | 100 | 51 |