| Course Unit Code | 9360-0144/03 |
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| Number of ECTS Credits Allocated | 2 ECTS credits |
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| Type of Course Unit * | Compulsory |
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| Level of Course Unit * | Second Cycle |
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| Year of Study * | First Year |
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| Semester when the Course Unit is delivered | Summer Semester |
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| Mode of Delivery | Face-to-face |
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| Language of Instruction | Czech |
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| Prerequisites and Co-Requisites | Course succeeds to compulsory courses of previous semester |
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| Name of Lecturer(s) | Personal ID | Name |
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| TOM24 | doc. Ing. Vladimír Tomášek, CSc. |
| Summary |
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| The subject follow up the lectures on scanning probe microscopy and electron microscopy. Applications of the methods (electron microscopy and microanalysis, AFM) will be practiced. Problems of chemical, structure and phase analysis of materials in micro- and nano- dimensions will be solved. Attention will be focused also on the samples preparation, results evaluation and interpretation of the results in nanotechnology. |
| Learning Outcomes of the Course Unit |
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| The goal is to practice application of electron microscopy and scanning probe microscopy methods including samples preparation and results evaluation. |
| Course Contents |
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1. Introduction to optical microscopy, sample preparation. Digital imaging and 3D mapping options.
2. Sample Preparation for Scanning Electron Microscopy (SEM) - Preparation of powder, piece and non-conductive specimens on discs. Fixing samples on a table in an electron microscope chamber. Applying a conductive layer, grounding the sample.
3. Imaging in secondary and backscattered electrons. Demonstration of phase and topographic contrast on suitable preparations (2-3 practical exercises).
4. Sample preparation for transmission electron microscopy (TEM). Excursion to TEM workplace in VŠB - TUO.
5. X-ray microanalysis - analysis of the chemical composition of the sample. Point analysis, mapping. Evaluation of the EDS record.
6. Analysis of own samples. Students will bring their own preparation for the analysis of morphology and chemical composition.
7. Sample Preparation for Scanning Transmission Electron Microscopy (STEM). Preparation of samples on the nets.
8. Analysis of size distribution of nanoparticles from TEM record using available software.
9. Excursions to FEI - Thermo Fisher Sci, Tescan.
10. Computational practice, examples of electron microscopy problematic.
11. Sample measurement by AFM in contact mode. Measurement of semiconductors and micropicks on the steel surface. Determination of roughness and height of puncture.
12. Sample measurement by AFM in non-contact (semi-contact)mode. Size and shape determination of powder samples (phyllo-silicates, oxides).
13. Sample measurement by AFM - MFM two - phase method. Determination of magnetic properties of solid samples.
14. Evaluation and editing of data obtained from the AFM. Evaluation and editing data using Image Analysis and Gwyddion software\'s. |
| Recommended or Required Reading |
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| Required Reading: |
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Study materials for laboratory practices.
YAO, Nan, WANG, Zhong Lin. Handbook of Microscopy for Nanotechnology. Springer US, 2005. ISBN 978-1-4020-8003-6. |
Výukové materiály k laboratorním úlohám.
ČECH BARABASZOVÁ, Karla, Kateřina MAMULOVÁ KUTLÁKOVÁ, Sylva HOLEŠOVÁ, Michal RITZ a Gražyna SIMHA MARTYNKOVÁ. Vybrané instrumentální metody analýzy materiálů a nanomateriálů. Brno: CERM, 2012. ISBN 978-80-7204-810-6.
YAO, Nan, WANG, Zhong Lin. Handbook of Microscopy for Nanotechnology. Springer US, 2005. ISBN 978-1-4020-8003-6. |
| Recommended Reading: |
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WATT, I. M. The Principles and Practice of Electron Microscopy. Cambridge University Press, 1997.
BONNELL, D editor. Scanning Probe Microscopy and Pectroscopy, Theory, Techniques and Application. Wiley-VCH, 2001. |
HULÍNSKÝ, Václav a Karel JUREK. Zkoumání látek elektronovým paprskem. Praha: SNTL, 1982.
JANDOŠ, František, Ríša ŘÍMAN a Antonín GEMPERLE. Využití moderních laboratorních metod v metalografii. Praha: SNTL, 1985.
WATT, I. M. The Principles and Practice of Electron Microscopy. Cambridge University Press, 1997.
VŮJTEK, Milan, Roman KUBÍNEK a Miroslav MAŠLÁŇ. Nanoskopie. Olomouc: Univerzita Palackého, 2012. ISBN 978-80-244-3102-4. |
| Planned learning activities and teaching methods |
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| Seminars, Experimental work in labs |
| Assesment methods and criteria |
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| Task Title | Task Type | Maximum Number of Points
(Act. for Subtasks) | Minimum Number of Points for Task Passing |
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| Graded credit | Graded credit | 100 | 51 |