| Course Unit Code | 636-3011/06 |
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| Number of ECTS Credits Allocated | 6 ECTS credits |
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| Type of Course Unit * | Compulsory |
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| Level of Course Unit * | Second Cycle |
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| Year of Study * | Second Year |
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| Semester when the Course Unit is delivered | Winter Semester |
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| Mode of Delivery | Face-to-face |
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| Language of Instruction | English |
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| Prerequisites and Co-Requisites | Course succeeds to compulsory courses of previous semester |
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| Name of Lecturer(s) | Personal ID | Name |
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| VOD37 | prof. Ing. Vlastimil Vodárek, CSc. |
| Summary |
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| The goal of the course is to make knowledge of students deeper in the field of structure characterization of progressive materials. The most important experimental techniques, their physical principles, possibilities and limitations are discussed. An attention is paid to interpretation of results, modern methods of specimen preparation, methodology of appropriate techniques selection for getting required information. Applications of structure characterization for solving material engineering tasks are presented on some examples from both engineering practice and development of new materials. |
| Learning Outcomes of the Course Unit |
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Gained knowledge: basic microscopic, diffraction and spectroscopy techniques used in materials engineering, possibilities and limitations of individual techniques of structure characterization, interpretation of results.
Gained skills: choice of an optimal structure characterization techniques for a task investigated, basic interpretation of structure characterisation results. |
| Course Contents |
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1. Basic reasons and goals of structure characterization at a wide range of length scales (macrostructure, microstructure, nanostructure). Comparison of spatial resolution limits of microscopic techniques.
2. Light microscopy. Principle of light microscope. Preparation of specimens. Typical tasks of light microscopy at quality control of materials – microstructure, micro-cleanliness and grain size. Quantitative metallography, automated image analysis. Analysis of projected images. Errors of measurement.
3. Interaction of X-ray and electrons with specimens. Basic rules for reciprocal lattice. Geometrical conditions of diffraction. Bragg´s law and Ewald sphere.
4. X-ray diffraction analysis of polycrystalline materials. Typical tasks of X-ray diffraction analysis. Quantitative analysis – methods of internal and external standards, standardless analysis.
5. Evaluation of residual stresses. Macro-stress, determination of particle size in coarse grained materials. Principles of texture evaluation. X-ray diffraction analysis on single crystals. X- ray fluorescence analysis. Neutron diffraction.
6. Instruments based on focused electron beam. Principles of transmission and scanning electron microscopes.
7. Contrast mechanisms in transmission electron microscopy: amplitude, phase and Z contrasts. Basic principles of kinematic and dynamic theory of electron scattering, contrast on crystallographic defects.
8. High resolution transmission electron microscopy (HRTEM).
9. Preparation of specimens for transmission electron microscopy. Focused ion beam technique.
10. Electron diffraction techniques: selected area diffraction and convergent beam diffraction. Interpretation of diffraction patterns from single crystals and polycrystalline materials. EDX and EELS techniques.
11. Contrast mechanisms in scanning electron microscopy. Interpretation of images in secondary electrons and in backscattered electrons. Electron back scattered diffraction (EBSD).
12. X ray microanalysis: wave and energy dispersive analyses (EDX and WDX). Auger spectroscopy.
13. Probe scanning microscopy: AFM, STM and MFM. Field ion microscopy and atom probe tomography (APT).
14. Examples of structure characterization in the field of materials engineering. |
| Recommended or Required Reading |
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| Required Reading: |
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VODÁREK, V. Structure characterization of materials. Ostrava: VŠB – TU Ostrava, 2015. Available from:
http://katedry.fmmi.vsb.cz/Opory_FMMI/636/636-Strukturne_fazova_analyza.pdf.
WILLIAMS, D. B. and C. B. CARTER. Transmission electron microscopy, A textbook for materials science. 2nd edition, Springer US, 2012. ISBN 978-0-387-76502-0.
GOLDSTEIN, J., et al. Scanning electron microscopy and X – ray microanalysis. 3rd edition, New York: Springer US, 2003. ISBN 978-0-306-47292-3.
WHISTON, C. X-ray methods (analytical chemistry by open learning), J. Wiley & Sons, 1987. ISBN 978-0471913863. |
VODÁREK, V. Strukturně fázová analýza, Ostrava: VŠB –TU Ostrava, 2013. Dostupné z: http://katedry.fmmi.vsb.cz/Opory_FMMI/636/636-Strukturne_fazova_analyza.pdf.
KARLÍK, M. Úvod do transmisní elektronové mikroskopie, Praha: CVUT, 2011. ISBN 978-80-01-04729-3.
ASM handbook, volume 10 - materials characterization. 5th edition, Ohio: ASM international, 1998. ISBN 978-0-87170-016-2.
ENGLER, O. a V. RANDLE. Introduction to texture analysis: macrotexture, microtexture and orientation mapping. 2nd edition, Boca Raton: CRC Press, 2010. ISBN 9781420063653.
HULÍNSKÝ, V. a K. JUREK. Zkoumání látek elektronovým paprskem. Praha: SNTL, 1982. |
| Recommended Reading: |
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DYSON, D. J. X-ray and electron diffraction studies in materials science, London: Maney Publishing, 2003. ISBN 1-902653- 74- 2.
THOMAS G. Transmission electron microscopy. New York: J. Wiley & Sons, 1980. |
WILLIAMS, D. B. a C. B. CARTER. Transmission electron microscopy, A textbook for materials science. 2nd edition, Springer US, 2012. ISBN 978-0-387-76502-0.
JANDOŠ, F., R. ŘÍMAN a A. GEMPERLE: Využití moderních laboratorních metod v metalografii, Praha: SNTL, 1985.
GOLDSTEIN, J., et al. Scanning electron microscopy and X – ray microanalysis. 3rd edition, New York: Springer US, 2003. ISBN 978-0-306-47292-3. |
| Planned learning activities and teaching methods |
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| Lectures, Tutorials, Experimental work in labs |
| Assesment methods and criteria |
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| Task Title | Task Type | Maximum Number of Points
(Act. for Subtasks) | Minimum Number of Points for Task Passing |
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| Credit and Examination | Credit and Examination | 100 (100) | 51 |
| Credit | Credit | 35 | 21 |
| Examination | Examination | 65 | 30 |