| Course Unit Code | 480-2042/01 |
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| Number of ECTS Credits Allocated | 2 ECTS credits |
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| Type of Course Unit * | Choice-compulsory type A |
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| Level of Course Unit * | First Cycle |
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| Year of Study * | Second Year |
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| Semester when the Course Unit is delivered | Summer Semester |
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| Mode of Delivery | Face-to-face |
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| Language of Instruction | Czech |
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| Prerequisites and Co-Requisites | Course succeeds to compulsory courses of previous semester |
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| Name of Lecturer(s) | Personal ID | Name |
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| UHL72 | Mgr. Radim Uhlář, Ph.D. |
| Summary |
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| The practicals follow the theoretical subjects called Physics II, devoted to electromagnetic field, and supply the basic practical exercises. Not only the measurement realization itself, but also its correct processing and evaluation is emphasized. |
| Learning Outcomes of the Course Unit |
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Summarize the basic principles of the theory of physical measurement and the measurement uncertainty.
Describe and explain the physical laws that are the basis of individual measurement methods.
Apply measurement methods and the theory of uncertainty in the practical measurement of physical quantities in the field of electromagnetic field. |
| Course Contents |
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1. Introduction to the methodology of performing individual experimental tasks.
2. Cyclic measurement of the following tasks:
- Measurement of electromotive voltage of a galvanic cell by the compensation method
- Measurement of the specific charge of the electron from the radius of its trajectory in the magnetic field.
- Measurement of the dielectric permittivity of fluid by AC bridge.
- Measurement of resonance characteristics of a serial RLC circuit.
- Induced voltage measurement depending on the position of the secondary coil.
- Measurement of carrier mobility using the Hall probe.
- Measurement of the temperature dependence of the resistance of the resistor.
- Measurement of the bandgap from the temperature dependence of the semiconductor resistance.
- Measurement of the VA characteristic of the semiconductor diode.
- Measurement of transistor characteristics. |
| Recommended or Required Reading |
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| Required Reading: |
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Hejtmanová D., Ripka P., Sedláček M.: Electrical measurements and instrumentation: laboratory exercises, Praha: Vydavatelství ČVUT, 2002, ISBN 80-01-02475-X
Dally J.W, Riley W. E., McConnell K.G.: Instrumentation for engineering measurements - 2nd ed.. - New York : Wiley, 1993,ISBN 0-471-60004-0 |
KOPEČNÝ, J. a kol.: Fyzikální měření. VŠB TU Ostrava, Ostrava, 1967;CHUDÝ,V.,
PALENČÁR, R., KUREKOVÁ, E., HALAJ, M.: Meranie technických veličín. Slovenská
technická univerzita v Bratislavě, 1999;
BROŽ, J.: Základy fyzikálních měření. SPN, Praha, 1999;
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| Recommended Reading: |
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HALLIDAY, D., RESNICK, R. WALKER, J.: Fundamentals of
Physics, John Wiley and Sons, Inc. 1997. |
HORÁK, Z.: Praktická fyzika. SNTL, Praha, 1958;
HALLIDAY, D., RESNICK, R. WALKER, J.: Fyzika 3. Elektřina a magnetismus. Vyd.
1., Praha: Vutium a Prometheus, 2001 z anglického originálu Fundamentals of
Physics, John Wiley and Sons, Inc. 1997. |
| Planned learning activities and teaching methods |
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| Experimental work in labs |
| Assesment methods and criteria |
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| Task Title | Task Type | Maximum Number of Points
(Act. for Subtasks) | Minimum Number of Points for Task Passing |
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| Graded credit | Graded credit | 100 | 51 |