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Terminated in academic year 2021/2022

Programming of Measurement Systems

Type of study Follow-up Master
Language of instruction English
Code 450-4011/03
Abbreviation MSP
Course title Programming of Measurement Systems
Credits 5
Coordinating department Department of Cybernetics and Biomedical Engineering
Course coordinator prof. Ing. Petr Bilík, Ph.D.

Subject syllabus

Lectures:
1. Trends in the development of measurement techniques, measurement systems architecture - the possibility of use, the role of software in these architectures
2. Development of user application programs to measure. Graphically oriented development environment - the structure and capacity development environment LabVIEW. Possible ways of storing the measured data (ASCII, BIN, XML, DataTypeFile, TDMS). Structured storage of technical data TDMS.
3. Software management tool of the measured data. NI DataFinder. DIAdem viewing, searching, analysis and development of protocols. Creating a TDM file with the appropriate properties, and open it in Excel, DIAdem.
4. Software tools enable the implementation of measuring systems able to edit and analyze the measured signal without programming NI SignalExpress. Function for adjusting the measured signal, functions to analyze the signal in time and frequency domain functions for statistical processing of the signal.
5. Text-oriented development environment for creating measurement systems LabWindows CVI. Principle of work environment, UIR, callback functions, timer.
6. LabWindows CVI. Measurement card in CVI, the graph in time, spectrum.
7. LabWindows CVI. Menu, work with multiple panels. Entering SP.
8. Development environment for creating, editing and debugging TestStand test sequences. The basic philosophy, structure. Advantages, applications in automated test systems in the testing of industrial production.
9. Optical control of products - NI Vision. Programming systems for measuring the optical application of production control.
10. Development environment and hardware platform for automated measurement and control systems in real time: cRIO, RT LV, LV embedded.
11. Measurement systems that produce results in time domain and frequency domain. Software support, digital oscilloscope functions, conditions for triggering, mask trigger.
12. Automated test systems based on virtual instrumentation.
13. News in the automation of measurement and testing.

Computer labs:
1. Measurement systems architecture - the possibility of use, the role of software in these architectures - the presentation of different concepts
2. Principles work in LabVIEW work with BIN and TDMS files in LabVIEW.
3. Principles work in DIAdem, use properties TDMS files.
4. Implementation of a simple system for collecting measurement data in LabVIEW SignalExpress
5. Introduction to text-oriented development environment CVI - its structure.
6. Getting the libraries in CVI-realization of simple application for collecting measurement data visualization.
7. Creating complex user interfaces in CVI.
8. Improvement work in CVI.
9. Programming measuring systems for optical control output - software support in the graphics-oriented development environment
10. Case study programming virtual measuring system for data collection and analysis in time domain
11. Case study programming virtual measuring system for data collection and analysis in the frequency domain
12. Programming of measuring systems for real-time OS in LabVIEW
13. Programming embedded systems of measurement in LabVIEW

Projects:
Case study of an automated measuring system.

Literature

Getting started with LabWindows/CVI, National Instruments, Austin, 2013

Getting started with DIAdem, National Instruments, Austin, 2012

NI DIAdem Data Mining, Analysis and Report Generation, National Instruments, Austin, 2012

SONKA, Milan., Vaclav. HLAVAC a Roger BOYLE. Image processing, analysis, and machine vision. 3rd ed. Toronto: Thompson Learning, c2008. ISBN 978-0-495-08252-1.

Advised literature

KHALID, Shahid F. LabWindows/CVI programming for beginners. Upper Saddle River, N.J.: Prentice Hall, 2000, xliv, 651 p. ISBN 01-301-6512-3 .