Terminated in academic year 2010/2011

Reliability of Electronic Devices

Type of study	Master
Language of instruction	Czech
Code	457-0934/01
Abbreviation	SEZ
Course title	Reliability of Electronic Devices
Credits	10
Coordinating department	Department of Applied Mathematics
Course coordinator	prof. Ing. Radim Briš, CSc.

Subject syllabus

Lectures:
Reliability analysis during the design phase-predicted reliability of equipment
and systems with simple structures.
Reliability block diagram, failure rate of electronic components (EC) in different operating conditions.
Reliability of systems with complex structures, successful path method, drift failures.
Qualification tests for components and assemblies-selection criteria for EC, long term behavior of performance parameters, qualification tests for complex EC, failure mechanisms of EC.
Reliability and availability of repairable systems-systems with and without redundancy, with complex structure.
Statistical quality control and reliability tests. Quality and reliability assurance during the production phase-testing and screening of EC.

Literature

Misra K.B.; Reliability Analysis and Prediction, Elsevier 1992,
ISBN 0-444-89606-6.
Ushakov I.A., Handbook of Reliability Engineering, Wiley 1994,

Birolini A.: Quality and Reliability of Technical Systems, Springer 1997,

Nelson W., Accelerated Testing-Statistical Models, Test Plans,and Data
Analysis, Wiley 1990,ISBN 0-471-52277-5
J. Bednařík: Technika spolehlivosti v elektronické praxi, SNTL, Praha 1990

Doporučená literatura

J. Bednařík: Technika spolehlivosti v elektronické praxi, SNTL, Praha 1990
Birolini A.: Quality and Reliability of Technical Systems, Springer 1997,

Ushakov I.A., Handbook of Reliability Engineering, Wiley 1994,

back to search page