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Reliability of Electronic Devices

Type of study Doctoral
Language of instruction English
Code 470-6402/02
Abbreviation SEZ
Course title Reliability of Electronic Devices
Credits 10
Coordinating department Department of Applied Mathematics
Course coordinator prof. Ing. Radim Briš, CSc.

Subject syllabus

Lectures:
Reliability analysis during the design phase-predicted reliability of equipment
and systems with simple structures.
Reliability block diagram, failure rate of electronic components (EC) in different operating conditions.
Reliability of systems with complex structures, successful path method, drift failures.
Qualification tests for components and assemblies-selection criteria for EC, long term behavior of performance parameters, qualification tests for complex EC, failure mechanisms of EC.
Reliability and availability of repairable systems-systems with and without redundancy, with complex structure.
Statistical quality control and reliability tests. Quality and reliability assurance during the production phase-testing and screening of EC.

E-learning

Basic materials are available on the educator's website:
http://homel.vsb.cz/~bri10,
Teaching,
MTS pro PES.zip

Literature

Misra K.B.; Reliability Analysis and Prediction, Elsevier 1992, ISBN 0-444-89606-6.
Ushakov I.A., Handbook of Reliability Engineering, Wiley 1994,
ISBN 0-471-57173-3 

Advised literature

Birolini A.: Quality and Reliability of Technical Systems, Springer 1997, ISBN 3-540-63310-3 
Nelson W., Accelerated Testing-Statistical Models, Test Plans,and Data Analysis, Wiley 1990,ISBN 0-471-52277-5