ECKERTOVA L.: Physics of Thin Films, Plenum Publishing Co., New York, SNTL Praha, 1986
DANILATOS G.D.: Advances in Electronics and Electron Physics, 78 (1990), 102
Terminated in academic year 2023/2024
Physical Methods of Material Analysis
| Type of study | Bachelor |
|---|---|
| Language of instruction | Czech |
| Code | 480-2023/01 |
| Abbreviation | FMAM |
| Course title | Physical Methods of Material Analysis |
| Credits | 5 |
| Coordinating department | Department of Physics |
| Course coordinator | doc. Ing. Irena Hlaváčová, Ph.D. |
Subject syllabus
1. Introduction to Measurement Theory - Fundamentals of Metrology.
2. Electronic structure of substances. Electromagnetic radiation
3. Analytical methods based on the interaction of photons with substance I:
photoelectron spectroscopy.
4. Analytical methods based on the interaction of photons with substance II:
X-ray spectroscopy.
5. Analytical methods based on photon interaction with substance III:
defectoscopy and diffraction.
6. Analytical methods based on interaction of electrons with substance I:
electron microscopy (scanning, Auger)
7. Analytical methods based on interaction of electrons with substance II:
electron diffraction
8. Analytical methods based on interaction of electrons with substance III:
X-ray microanalysis, mass spectroscopy
9. Analytical method based on neutron interaction with substance: neutron diffraction.
10. Analytical methods based on the interaction of ions with the substance:
Spectroscopy of scattered, slow, secondary ions, Rutherford back scattering
11. Autoemission microscopy and spectroscopy
12. Nuclear resonance methods - NMR, Mössbauer spectroscopy.
13. Special experimental techniques (magnetic, optical, magnetooptic ...)
2. Electronic structure of substances. Electromagnetic radiation
3. Analytical methods based on the interaction of photons with substance I:
photoelectron spectroscopy.
4. Analytical methods based on the interaction of photons with substance II:
X-ray spectroscopy.
5. Analytical methods based on photon interaction with substance III:
defectoscopy and diffraction.
6. Analytical methods based on interaction of electrons with substance I:
electron microscopy (scanning, Auger)
7. Analytical methods based on interaction of electrons with substance II:
electron diffraction
8. Analytical methods based on interaction of electrons with substance III:
X-ray microanalysis, mass spectroscopy
9. Analytical method based on neutron interaction with substance: neutron diffraction.
10. Analytical methods based on the interaction of ions with the substance:
Spectroscopy of scattered, slow, secondary ions, Rutherford back scattering
11. Autoemission microscopy and spectroscopy
12. Nuclear resonance methods - NMR, Mössbauer spectroscopy.
13. Special experimental techniques (magnetic, optical, magnetooptic ...)
Literature
Advised literature
DOEHNE E., BOWER N.W.: Microscopy and Microanalysis, 2, (1997), 535-563
COWLEY J.M.: Diffraction Physics, N. Holland Publishing Co., Amsterdam 1979
COWLEY J.M.: Diffraction Physics, N. Holland Publishing Co., Amsterdam 1979