1. Measurement of refractive index - refractometry
- refractive index and dispersion, total refractometers, surface waves based refractometers, interference refractometers
2. Optical microscopy
- optical microscope, phase contrast microscope, microscope with a polarized light, confocal microscope, fluorescence microscope
3. Measurement of surface topography
- confocal scanning microscopy, interference microscopy, spectral interferometry
4. Measurement of lengths and their changes, velocimetry
- time-domain interferometry, triangulation, time-of-flight method, spectral interferometry, Doppler anemometry, an interference method of crossed beams
5. Determination of course of physical fields
- interferometry, interferometry with a polarized light (photoelasticimetry), holography
6. Spectroscopy
- prism and grating spectrometers, compact spectrometers, Fourier spectrometers
- refractive index and dispersion, total refractometers, surface waves based refractometers, interference refractometers
2. Optical microscopy
- optical microscope, phase contrast microscope, microscope with a polarized light, confocal microscope, fluorescence microscope
3. Measurement of surface topography
- confocal scanning microscopy, interference microscopy, spectral interferometry
4. Measurement of lengths and their changes, velocimetry
- time-domain interferometry, triangulation, time-of-flight method, spectral interferometry, Doppler anemometry, an interference method of crossed beams
5. Determination of course of physical fields
- interferometry, interferometry with a polarized light (photoelasticimetry), holography
6. Spectroscopy
- prism and grating spectrometers, compact spectrometers, Fourier spectrometers