1. Measurement of refractive index of isotropic and anisotropic media
1.1. Refractive index as characteristics of a medium. Phase and group refractive index, chromatic dispersion.
1.2. Kramers-Kroning dispersion relation. Semiempirical dispersion relation (Sellmeier, Cauchy, and so on).
1.3. Methods of measurement of phase and group refractive index. Fraunhoffer method, reflectometric methods, interferometric methods, ellipsometric methods.
1.4. Total refractometers (Abbe), Michelson, Mach-Zehnder and Rayleigh interferometer. Spectral ellipsometer. Fiber refractometers.
2. Measurement of dispersion of photonic crystal fibers
2.1. Material dispersion, vaweguiding and chromatic dispersion. Polarization mode dispersion, phase and group birefringence.
2.2. Theory of propagation of electromagnetic vawes in photonic crystal fibers. Modes and dispersion relation of modes.
2.3. Methods of measurement of dispersion of photonic crystal fibers. Time-domain method (time of flight), phase method, interferometric methods.
2.4. White-light spectral interferometry. Michelson interferometer (measurement of group birefringence). Mach-Zehnder interferometer (measurement of group and chromatic dispersion). Spectral method of measurement of phase birefringence. Polarimetric measurement of phase and group birefringence.
3. Optical reflectometry and ellipsometry
3.1. Fresnel relations. Complex reflection and transmission coefficients. Power reflection and transmission coefficients. Ellipsometric parameters.
3.2. Reflection of electromagnetic vawe from a thin film and multilayered film. Interferometric, reflectometric and ellipsometric determination of thin-film parameters.
3.3. Methods of measurement at normal incidence: spectral interferometry and reflectometry.
3.3. Methods of measurement at oblique incidence: spectral reflectometry and ellipsometry.
3.4. Commercial optical interferometers, reflectometers, ellipsometers.
4. Optical profilometry
4.1. Low-coherence optical profilometry. Spectral profilometry and profilometry with a light source of continuously varied wavelength.
4.2. Commercial optical profilometers.
1.1. Refractive index as characteristics of a medium. Phase and group refractive index, chromatic dispersion.
1.2. Kramers-Kroning dispersion relation. Semiempirical dispersion relation (Sellmeier, Cauchy, and so on).
1.3. Methods of measurement of phase and group refractive index. Fraunhoffer method, reflectometric methods, interferometric methods, ellipsometric methods.
1.4. Total refractometers (Abbe), Michelson, Mach-Zehnder and Rayleigh interferometer. Spectral ellipsometer. Fiber refractometers.
2. Measurement of dispersion of photonic crystal fibers
2.1. Material dispersion, vaweguiding and chromatic dispersion. Polarization mode dispersion, phase and group birefringence.
2.2. Theory of propagation of electromagnetic vawes in photonic crystal fibers. Modes and dispersion relation of modes.
2.3. Methods of measurement of dispersion of photonic crystal fibers. Time-domain method (time of flight), phase method, interferometric methods.
2.4. White-light spectral interferometry. Michelson interferometer (measurement of group birefringence). Mach-Zehnder interferometer (measurement of group and chromatic dispersion). Spectral method of measurement of phase birefringence. Polarimetric measurement of phase and group birefringence.
3. Optical reflectometry and ellipsometry
3.1. Fresnel relations. Complex reflection and transmission coefficients. Power reflection and transmission coefficients. Ellipsometric parameters.
3.2. Reflection of electromagnetic vawe from a thin film and multilayered film. Interferometric, reflectometric and ellipsometric determination of thin-film parameters.
3.3. Methods of measurement at normal incidence: spectral interferometry and reflectometry.
3.3. Methods of measurement at oblique incidence: spectral reflectometry and ellipsometry.
3.4. Commercial optical interferometers, reflectometers, ellipsometers.
4. Optical profilometry
4.1. Low-coherence optical profilometry. Spectral profilometry and profilometry with a light source of continuously varied wavelength.
4.2. Commercial optical profilometers.