- Defectoscopy of isotropic samples by a method of interferometry (dispersion and thickness measurement, respectively).
- Defectoscopy of anisotropic samples by a method of interferometry (dispersion and thickness measurement, respectively).
- Defectoscopy of thin films and structures by a method of reflectometry, polarimetry and interferometry (thickness and geometry measurement of a structure, respectively).
- Defectoscopy of thin films by a method of optical microscopy.
- Defectoscopy of optical fibres by methods of optical interferometry.
- Defectoscopy of anisotropic samples by a method of interferometry (dispersion and thickness measurement, respectively).
- Defectoscopy of thin films and structures by a method of reflectometry, polarimetry and interferometry (thickness and geometry measurement of a structure, respectively).
- Defectoscopy of thin films by a method of optical microscopy.
- Defectoscopy of optical fibres by methods of optical interferometry.