1. Defectoscopy of izotropic samples by an interferometric method (dispersion measurement, thickness measurement).
2. Defectoscopy of anizotropic samples by an interferometric method (dispersion measurement, thickness measurement).
3. Defectoscopy of thin films and structures metodou by a reflectometric, polarimetric and interferometric method (thickness measurement, geometry measurement of a structure).
4. Defectoscopy of thin films by a method of optical microscopy.
5. Defectoscopy of optical fibres by methods of optical interferometry.
6. Physical introduction in magnetic defectoscopy.
7. Magnetic defectoscopy of steel ropes and pipes (survey of rope states) by a method of flow dissipation.
8. Magnetic defectoscopy by means of whirling currents.
2. Defectoscopy of anizotropic samples by an interferometric method (dispersion measurement, thickness measurement).
3. Defectoscopy of thin films and structures metodou by a reflectometric, polarimetric and interferometric method (thickness measurement, geometry measurement of a structure).
4. Defectoscopy of thin films by a method of optical microscopy.
5. Defectoscopy of optical fibres by methods of optical interferometry.
6. Physical introduction in magnetic defectoscopy.
7. Magnetic defectoscopy of steel ropes and pipes (survey of rope states) by a method of flow dissipation.
8. Magnetic defectoscopy by means of whirling currents.