Lectures:
- Basic reasons and aims of structure characterisation in technical materials at different scale levels (macrostructure, microstructure, nanostructure). Comparison of spatial resolution of various experimental techniques.
- Light microscopy. Principle of light microscope. Preparation of specimens. Typical applications of light microscopy in quality assessment of materials: microcleanliness, microstructure and grain size.
- Quantitative microscopy, automated image analysis, basic stereological parameters,. Analysis of projected images. Principles of stereological evaluations. Measurement errors.
- Interaction of X-rays or electron beam with a specimen. Basic properties of reciprocal lattice. Geometrical conditions of diffraction: Bragg´s law and Ewald sphere.
- X-ray diffraction methods of analysis of polycrystalline materials. Typical tasks of X-ray diffraction analysis. Quantitative analyses - internal standard and external standard methods, standardless method.
- Tensometry. Macrostresses, evaluation of grain size in coarse grained materials. Evaluation of microstresses: 2nd and 3rd order stresses.
- Principles of preffered orientation evaluation - texture analysis. X-ray diffraction analysis of monocrystals. X-ray fluorescence analysis of elemental composition. Neutron diffraction.
- Instrumentation based on applications of focused electron beam. Principles of transmission and scanning electron microscope.
- Mechanisms of contrast formation in transmission electron microscope: amplitude and phase contrast. Basic principles of kinematic and dynamic theory of electron scattering, contrast on crystal lattice defects. Transmission electron microscopy with high resolution (HRTEM).
- Preparation of specimens for transmission electron microscopy. Focused ion beam technique (FIB).
- Electron diffraction techniques: selected area diffraction and diffraction of convergent electron beam. Interpretation of diffraction patterns from monocrystals and polycrystals.Spectroscopic techniques EDX and EELS.
- Mechanisms of contrast formation in scanning electron microscopy. Interpretation of secondary electron images and back scattered electron images. Diffraction of backscattred electrons (EBSD). X-ray microanalysis: wave length and energy dispersive spectroscopy. Auger electron spectroscopy.
- Scanning probe microscopy techniques - AFM, STM, MFM. Ion field microscopy.
- Examples of applications of structural characterisation in materials engineering.
Seminars:
1. Introduction.
2. Preparation of specimens for light microscopy, qualitative phase analysis.
3. Quantitative analysis of projected images using automated image analysis.
4. Microcleanliness evalution of steels.
5. Structure factor.
6. Qualitative and quantitative X-ray diffraction analysis.
7. Test - light microscopy and X-ray diffraction analysis.
8. Calculation of diffraction constant of transmission electron microscope.
9. Interpretation of ring and spot electron diffraction patterns.
10. Interpretation of diffraction patterns with Kikuchi lines.
11. Dislocation density evaluation.
12. Application of transformation matrices for interpretation of composed diffraction patterns.
13. Analysis of orientation relationships using composed diffraction patterns.
14. Final test. Credit.
- Basic reasons and aims of structure characterisation in technical materials at different scale levels (macrostructure, microstructure, nanostructure). Comparison of spatial resolution of various experimental techniques.
- Light microscopy. Principle of light microscope. Preparation of specimens. Typical applications of light microscopy in quality assessment of materials: microcleanliness, microstructure and grain size.
- Quantitative microscopy, automated image analysis, basic stereological parameters,. Analysis of projected images. Principles of stereological evaluations. Measurement errors.
- Interaction of X-rays or electron beam with a specimen. Basic properties of reciprocal lattice. Geometrical conditions of diffraction: Bragg´s law and Ewald sphere.
- X-ray diffraction methods of analysis of polycrystalline materials. Typical tasks of X-ray diffraction analysis. Quantitative analyses - internal standard and external standard methods, standardless method.
- Tensometry. Macrostresses, evaluation of grain size in coarse grained materials. Evaluation of microstresses: 2nd and 3rd order stresses.
- Principles of preffered orientation evaluation - texture analysis. X-ray diffraction analysis of monocrystals. X-ray fluorescence analysis of elemental composition. Neutron diffraction.
- Instrumentation based on applications of focused electron beam. Principles of transmission and scanning electron microscope.
- Mechanisms of contrast formation in transmission electron microscope: amplitude and phase contrast. Basic principles of kinematic and dynamic theory of electron scattering, contrast on crystal lattice defects. Transmission electron microscopy with high resolution (HRTEM).
- Preparation of specimens for transmission electron microscopy. Focused ion beam technique (FIB).
- Electron diffraction techniques: selected area diffraction and diffraction of convergent electron beam. Interpretation of diffraction patterns from monocrystals and polycrystals.Spectroscopic techniques EDX and EELS.
- Mechanisms of contrast formation in scanning electron microscopy. Interpretation of secondary electron images and back scattered electron images. Diffraction of backscattred electrons (EBSD). X-ray microanalysis: wave length and energy dispersive spectroscopy. Auger electron spectroscopy.
- Scanning probe microscopy techniques - AFM, STM, MFM. Ion field microscopy.
- Examples of applications of structural characterisation in materials engineering.
Seminars:
1. Introduction.
2. Preparation of specimens for light microscopy, qualitative phase analysis.
3. Quantitative analysis of projected images using automated image analysis.
4. Microcleanliness evalution of steels.
5. Structure factor.
6. Qualitative and quantitative X-ray diffraction analysis.
7. Test - light microscopy and X-ray diffraction analysis.
8. Calculation of diffraction constant of transmission electron microscope.
9. Interpretation of ring and spot electron diffraction patterns.
10. Interpretation of diffraction patterns with Kikuchi lines.
11. Dislocation density evaluation.
12. Application of transformation matrices for interpretation of composed diffraction patterns.
13. Analysis of orientation relationships using composed diffraction patterns.
14. Final test. Credit.