Lectures:
- Basic reasons and aims of structure characterisation in technical materials at different scale levels (macrostructure, microstructure, nanostructure). Comparison of spatial resolution of various experimental techniques.
- Light microscopy. Principle of light microscope. Preparation of specimens. Typical applications of light microscopy in quality assessment of materials: microcleanliness, microstructure and grain size.
- Quantitative microscopy, automated image analysis, basic stereological parameters,. Analysis of projected images. Principles of stereological evaluations. Measurement errors.
- Interaction of X-rays or electron beam with a specimen. Basic properties of reciprocal lattice. Geometrical conditions of diffraction: Bragg´s law and Ewald sphere.
- X-ray diffraction methods of analysis of polycrystalline materials. Typical tasks of X-ray diffraction analysis. Quantitative analyses - internal standard and external standard methods, standardless method.
- Tensometry. Macrostresses, evaluation of grain size in coarse grained materials. Evaluation of microstresses: 2nd and 3rd order stresses.
- Principles of preffered orientation evaluation - texture analysis. X-ray diffraction analysis of monocrystals. X-ray fluorescence analysis of elemental composition. Neutron diffraction.
- Instrumentation based on applications of focused electron beam. Principles of transmission and scanning electron microscope.
- Mechanisms of contrast formation in transmission electron microscope: amplitude and phase contrast. Basic principles of kinematic and dynamic theory of electron scattering, contrast on crystal lattice defects. Transmission electron microscopy with high resolution (HRTEM).
- Preparation of specimens for transmission electron microscopy. Focused ion beam technique (FIB).
- Electron diffraction techniques: selected area diffraction and diffraction of convergent electron beam. Interpretation of diffraction patterns from monocrystals and polycrystals.Spectroscopic techniques EDX and EELS.
- Mechanisms of contrast formation in scanning electron microscopy. Interpretation of secondary electron images and back scattered electron images. Diffraction of backscattred electrons (EBSD). X-ray microanalysis: wave length and energy dispersive spectroscopy. Auger electron spectroscopy.
- Scanning probe microscopy techniques - AFM, STM, MFM. Ion field microscopy.
- Examples of applications of structural characterisation in materials engineering.
- Basic reasons and aims of structure characterisation in technical materials at different scale levels (macrostructure, microstructure, nanostructure). Comparison of spatial resolution of various experimental techniques.
- Light microscopy. Principle of light microscope. Preparation of specimens. Typical applications of light microscopy in quality assessment of materials: microcleanliness, microstructure and grain size.
- Quantitative microscopy, automated image analysis, basic stereological parameters,. Analysis of projected images. Principles of stereological evaluations. Measurement errors.
- Interaction of X-rays or electron beam with a specimen. Basic properties of reciprocal lattice. Geometrical conditions of diffraction: Bragg´s law and Ewald sphere.
- X-ray diffraction methods of analysis of polycrystalline materials. Typical tasks of X-ray diffraction analysis. Quantitative analyses - internal standard and external standard methods, standardless method.
- Tensometry. Macrostresses, evaluation of grain size in coarse grained materials. Evaluation of microstresses: 2nd and 3rd order stresses.
- Principles of preffered orientation evaluation - texture analysis. X-ray diffraction analysis of monocrystals. X-ray fluorescence analysis of elemental composition. Neutron diffraction.
- Instrumentation based on applications of focused electron beam. Principles of transmission and scanning electron microscope.
- Mechanisms of contrast formation in transmission electron microscope: amplitude and phase contrast. Basic principles of kinematic and dynamic theory of electron scattering, contrast on crystal lattice defects. Transmission electron microscopy with high resolution (HRTEM).
- Preparation of specimens for transmission electron microscopy. Focused ion beam technique (FIB).
- Electron diffraction techniques: selected area diffraction and diffraction of convergent electron beam. Interpretation of diffraction patterns from monocrystals and polycrystals.Spectroscopic techniques EDX and EELS.
- Mechanisms of contrast formation in scanning electron microscopy. Interpretation of secondary electron images and back scattered electron images. Diffraction of backscattred electrons (EBSD). X-ray microanalysis: wave length and energy dispersive spectroscopy. Auger electron spectroscopy.
- Scanning probe microscopy techniques - AFM, STM, MFM. Ion field microscopy.
- Examples of applications of structural characterisation in materials engineering.