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Special Microscopy Techniques

Type of study Follow-up Master
Language of instruction Czech
Code 653-3027/02
Abbreviation SMM
Course title Special Microscopy Techniques
Credits 5
Coordinating department Department of Materials Engineering and Recycling
Course coordinator doc. Ing. Anastasia Volodarskaja, Ph.D.

Subject syllabus

1. Basic goals of structure characterization of materials in biomedical and materials engineering.
2. Products of electron interaction with a specimen.
3. X-ray absorption in solids. Diffraction of electrons on crystal lattice in cristalline materials.
4. Microscopy techniques based on focused electron beam.
5. Transmission electron microscope (TEM) – principle, spatial resolution, amplitude and phase contrast, diffraction analysis in TEM.
6. Problems related to investigations on biological specimens in TEM. Low voltage TEM.
7. Analytical electron microscopy.
8. Preparation of specimens for TEM from engineering materials(extraction replicas, thin foils – electrolytic thinning, FIB).
9. Preparation of specimens for TEM from biological materials (chemical and physical methods).
10. Scanning electron microscope (SEM): principle, spatial resolution and depth of focus, images in secondary and backscatter electrons, diffraction analysis in SEM.
11. Scanning electron microscopes with deteriorated vacuum level in the specimen chamber – low vacuum SEM (LVSEM) and environmental SEM(ESEM), possibilities and limitations of their applications for non-conductive specimens.
12. Preparation of biological specimens for SEM (crygenic and chemical methods).
13. X-ray microanalysis in SEM – energy and wave length dispersive analyses, qualitative and quantitative analyses, limits of detection.
14. Typical applications of electron microscopy in materials and biomedical engineering.

Literature

WILLIAMS, D. B. and C. B. CARTER. Transmission electron microscopy, A textbook for materials science. 2nd edition, Springer US, 2012.
ISBN 978-0-387-76502-0 .
DAWES, C. J. : Introduction to Biological Electron Microscopy: Theory and Techniques, Ladd Research Industries, Inc. Publisher Burlington, Vermont 1988.

Advised literature

GOLDSTEIN, J., et al. Scanning electron microscopy and X – ray microanalysis. 3rd edition, New York: Springer US, 2003. ISBN 978-0-306-47292-3 .