-History of light microscopy. The principle of the light microscope. Preparation of samples. Examples of typical light metallography tasks.
-Discovery of the electron, history of electron microscopy. Wavelength, accelerating voltage, resolution, calculation of resolution and magnification of an electron microscope. The basic working principle of transmission and scanning electron microscopes.
-Vacuum systems of electron microscopes. Lighting system, types of electron sources. Imaging defects, chromatic aberration, astigmatism. Depth of sharpness. Electromagnetic lenses.
-Interaction of the primary electron beam with matter, types of collisions. Interpretation of images in secondary electrons (SE) and reflected electrons (BSE). SE and BSE detectors, phase (material) and topographic contrast, excitation volume. Charging the preparation and its elimination. Work in low vacuum mode.
-Basic principles of sample preparation for scanning electron microscopy. Preparation of thin layers, sputtering with metal, carbon. Instrumentation for the preparation of preparations. Artifacts.
-Scanning electron microscope. X-ray spectral microanalysis: wave dispersive and energy dispersive analysis. Line analysis and mapping. Spectroscopy of Auger electrons. Electron Backscattered Diffraction (EBSD). Scanning transmission electron microscope. Tabletop electron microscopes.
- Mechanisms of contrast formation in transmission electron microscopy: amplitude and phase contrast, Z contrast. Basic principles of kinematic and dynamic theory of electron scattering, contrast on crystal lattice defects.
-Preparation of preparations for transmission electron microscopy. High resolution transmission electron microscopy (HRTEM).
-Electron diffraction methods: selective electron diffraction and diffraction of a convergent electron beam. Interpretation of diffractograms obtained during the study of single crystals and polycrystals. EDX and EELS spectroscopic techniques.
-Interaction of ion beam with matter. Dual beam microscopes, use of focused ion beam (FIB) for preparation of preparations for electron microscopy. 3D EBSD.
-Connecting electron microscopy with atomic force microscopy. Correlative microscopy. Combination of electron microscopy with other analytical techniques (Raman spectroscopy, mass spectroscopy).
-Theoretical foundations of scanning probe microscopy (SPM) methods. Breakdown of individual SPM techniques. Basic structural elements of microscopes.
-Microscopic techniques AFM, STM, MFM. AP tomography.
-Discovery of the electron, history of electron microscopy. Wavelength, accelerating voltage, resolution, calculation of resolution and magnification of an electron microscope. The basic working principle of transmission and scanning electron microscopes.
-Vacuum systems of electron microscopes. Lighting system, types of electron sources. Imaging defects, chromatic aberration, astigmatism. Depth of sharpness. Electromagnetic lenses.
-Interaction of the primary electron beam with matter, types of collisions. Interpretation of images in secondary electrons (SE) and reflected electrons (BSE). SE and BSE detectors, phase (material) and topographic contrast, excitation volume. Charging the preparation and its elimination. Work in low vacuum mode.
-Basic principles of sample preparation for scanning electron microscopy. Preparation of thin layers, sputtering with metal, carbon. Instrumentation for the preparation of preparations. Artifacts.
-Scanning electron microscope. X-ray spectral microanalysis: wave dispersive and energy dispersive analysis. Line analysis and mapping. Spectroscopy of Auger electrons. Electron Backscattered Diffraction (EBSD). Scanning transmission electron microscope. Tabletop electron microscopes.
- Mechanisms of contrast formation in transmission electron microscopy: amplitude and phase contrast, Z contrast. Basic principles of kinematic and dynamic theory of electron scattering, contrast on crystal lattice defects.
-Preparation of preparations for transmission electron microscopy. High resolution transmission electron microscopy (HRTEM).
-Electron diffraction methods: selective electron diffraction and diffraction of a convergent electron beam. Interpretation of diffractograms obtained during the study of single crystals and polycrystals. EDX and EELS spectroscopic techniques.
-Interaction of ion beam with matter. Dual beam microscopes, use of focused ion beam (FIB) for preparation of preparations for electron microscopy. 3D EBSD.
-Connecting electron microscopy with atomic force microscopy. Correlative microscopy. Combination of electron microscopy with other analytical techniques (Raman spectroscopy, mass spectroscopy).
-Theoretical foundations of scanning probe microscopy (SPM) methods. Breakdown of individual SPM techniques. Basic structural elements of microscopes.
-Microscopic techniques AFM, STM, MFM. AP tomography.