Content
1. Introduction- history, basic terms (definition of crystal, lattice types, Miller's indexes, crystallographic systems, minimal symmetry rules, reciprocal lattice).
2. Point symmetry, stereographic projection.
3. Group theory, crystallographic group of symmetry, symbols.
4. Matrix representation of symmetry operations.
5. Space group of symmetry; symbols, graphical illustration.
6. Crystallochemistry, crystallization processes, types of structure defects, crystal structure and chemical bond.
7. X-ray; principle, formation, forms, properties, registration, interaction with matter.
8. Diffraction of X-rays; Laue and Bragg equations; structural factor F (hkl).
9. X-ray diffraction methods, classification based on Ewald's scheme, Laue, Debye Scherrer, powder methods.
10. Powder diffractometers, indexation of powder patterns records, focusing methods, practical applications of powder methods.
11. Single crystal techniques; Weissenberg and precession method, types of diffractometers, complete X-ray analysis of crystal compounds.
1. Introduction- history, basic terms (definition of crystal, lattice types, Miller's indexes, crystallographic systems, minimal symmetry rules, reciprocal lattice).
2. Point symmetry, stereographic projection.
3. Group theory, crystallographic group of symmetry, symbols.
4. Matrix representation of symmetry operations.
5. Space group of symmetry; symbols, graphical illustration.
6. Crystallochemistry, crystallization processes, types of structure defects, crystal structure and chemical bond.
7. X-ray; principle, formation, forms, properties, registration, interaction with matter.
8. Diffraction of X-rays; Laue and Bragg equations; structural factor F (hkl).
9. X-ray diffraction methods, classification based on Ewald's scheme, Laue, Debye Scherrer, powder methods.
10. Powder diffractometers, indexation of powder patterns records, focusing methods, practical applications of powder methods.
11. Single crystal techniques; Weissenberg and precession method, types of diffractometers, complete X-ray analysis of crystal compounds.