1. Introduction to optical microscopy, sample preparation. Digital imaging and 3D mapping options.
2. Sample Preparation for Scanning Electron Microscopy (SEM) - Preparation of powder, piece and non-conductive specimens on discs. Fixing samples on a table in an electron microscope chamber. Applying a conductive layer, grounding the sample.
3. Imaging in secondary and backscattered electrons. Demonstration of phase and topographic contrast on suitable preparations (2-3 practical exercises).
4. Sample preparation for transmission electron microscopy (TEM). Excursion to TEM workplace in VŠB - TUO.
5. X-ray microanalysis - analysis of the chemical composition of the sample. Point analysis, mapping. Evaluation of the EDS record.
6. Analysis of own samples. Students will bring their own preparation for the analysis of morphology and chemical composition.
7. Sample Preparation for Scanning Transmission Electron Microscopy (STEM). Preparation of samples on the nets.
8. Analysis of size distribution of nanoparticles from TEM record using available software.
9. Excursions to FEI - Thermo Fisher Sci, Tescan.
10. Computational practice, examples of electron microscopy problematic.
11. Sample measurement by AFM in contact mode. Measurement of semiconductors and micropicks on the steel surface. Determination of roughness and height of puncture.
12. Sample measurement by AFM in non-contact (semi-contact)mode. Size and shape determination of powder samples (phyllo-silicates, oxides).
13. Sample measurement by AFM - MFM two - phase method. Determination of magnetic properties of solid samples.
14. Evaluation and editing of data obtained from the AFM. Evaluation and editing data using Image Analysis and Gwyddion software\'s.
2. Sample Preparation for Scanning Electron Microscopy (SEM) - Preparation of powder, piece and non-conductive specimens on discs. Fixing samples on a table in an electron microscope chamber. Applying a conductive layer, grounding the sample.
3. Imaging in secondary and backscattered electrons. Demonstration of phase and topographic contrast on suitable preparations (2-3 practical exercises).
4. Sample preparation for transmission electron microscopy (TEM). Excursion to TEM workplace in VŠB - TUO.
5. X-ray microanalysis - analysis of the chemical composition of the sample. Point analysis, mapping. Evaluation of the EDS record.
6. Analysis of own samples. Students will bring their own preparation for the analysis of morphology and chemical composition.
7. Sample Preparation for Scanning Transmission Electron Microscopy (STEM). Preparation of samples on the nets.
8. Analysis of size distribution of nanoparticles from TEM record using available software.
9. Excursions to FEI - Thermo Fisher Sci, Tescan.
10. Computational practice, examples of electron microscopy problematic.
11. Sample measurement by AFM in contact mode. Measurement of semiconductors and micropicks on the steel surface. Determination of roughness and height of puncture.
12. Sample measurement by AFM in non-contact (semi-contact)mode. Size and shape determination of powder samples (phyllo-silicates, oxides).
13. Sample measurement by AFM - MFM two - phase method. Determination of magnetic properties of solid samples.
14. Evaluation and editing of data obtained from the AFM. Evaluation and editing data using Image Analysis and Gwyddion software\'s.