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Terminated in academic year 2020/2021

Optical Spectroscopy and Ellipsometry of nanostructures

Type of study Doctoral
Language of instruction English
Code 9360-0224/02
Abbreviation OSEN
Course title Optical Spectroscopy and Ellipsometry of nanostructures
Credits 10
Coordinating department CNT - Nanotechnology Centre
Course coordinator doc. Dr. Mgr. Kamil Postava

Subject syllabus

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Literature

S. Svanberg, Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991
R. M. A. Azzam, N. M. Bashara, Ellipsometry and polarized light, North-Holland, Amsterdam 1977
H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications, John Wiley & Sons 2007
P. Griffiths, J. A. De Haseth, Fourier Transform Infrared Spectrometry (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications), Wiley 2nd. Ed, 2007

Advised literature

O. Stenzel, The physics of thin film optical spectra, Springer 2005
P.Y. You and M. Cardona, Fundamentals of semiconductors, 3rd Ed, Springer 2010
I. Ohlídal, D. Franta, Ellipsometry of thin film systems, In: Progress in Optics, Vol. 41, Ed. E. Wolf, 2000
H. Tompkins and E. Irene, Handbook of Ellipsometry, William Andrew 2005
D. S. Kliger, J. W. Lewis, C. E. Randall, Polarized light in optics and spectroscopy, Academic Press, New York 1990