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Optical Spectroscopy and Ellipsometry of nanostructures

Type of study Doctoral
Language of instruction English
Code 9360-0224/04
Abbreviation OSEN
Course title Optical Spectroscopy and Ellipsometry of nanostructures
Credits 10
Coordinating department CNT - Nanotechnology Centre
Course coordinator doc. Dr. Mgr. Kamil Postava

Osnova předmětu

1. Physical principles of optical spectroscopy and ellipsometry; electron transitions and origin of spectral dependences; modeling of material dielectric functions; Kramers-Kronig dispersion relations; spectral devices (dispersion prism, gratings, interferometers); optics of thin films, methods of effective medium and their application in optical spectroscopy
2. Reflection and transmission spectroscopy in visible, near-uv, and near ir range; components of spectrometer, double beam spectrometers, materials used in optical spectroscopy, spectral resolution and instrument function of monochromator
3. Spectroscopic ellipsometry; ellipsometric methods, measurement of psi and delta, generalized ellipsometry, Mueller matrix polarimetry; ellipsometers, averaging methods and errors comepensation
4. Spectroscopy in mid infrared spectral range
origin of infrared spectra, vibration and rotation spectroscopy, principles of Fourier transform infrared spectrometer (FTIR), interferogram treatment, special methods - ATR, IRRAS, modelling of absorption peaks, chemical analysis
5. Magneto-optical spectroscopy
origin of magneto-optical effects, Kerr, Faraday, and Voight magneto-optic effect, specific aspects of magneto-optical ellipsometers
6. Modern and additional methods of optical spectroscopy
emission spectroscopy, laser spectroscopy, photoluminiscence and fluorescence spectra, Raman spectroscopy, time-resolve spectroscopy, diffraction of periodic grating structures

Povinná literatura

S. Svanberg, Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991
R. M. A. Azzam, N. M. Bashara, Ellipsometry and polarized light, North-Holland, Amsterdam 1977
H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications, John Wiley & Sons 2007
P. Griffiths, J. A. De Haseth, Fourier Transform Infrared Spectrometry (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications), Wiley 2nd. Ed, 2007

Doporučená literatura

O. Stenzel, The physics of thin film optical spectra, Springer 2005
P.Y. You and M. Cardona, Fundamentals of semiconductors, 3rd Ed, Springer 2010
I. Ohlídal, D. Franta, Ellipsometry of thin film systems, In: Progress in Optics, Vol. 41, Ed. E. Wolf, 2000
H. Tompkins and E. Irene, Handbook of Ellipsometry, William Andrew 2005
D. S. Kliger, J. W. Lewis, C. E. Randall, Polarized light in optics and spectroscopy, Academic Press, New York 1990