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Reliability and Diagnostics

Reliability and Diagnostics
454-0310/01
čeština

Anotace

Diagnostics fundamental conceptions, structural test generation for combinational and sequential logical circuits, functional testing, testing by means of linear feedback register including symptom analyses and automatic test generators, extreme testing BST - Boundary Scan Testing. Reliability fundamental conceptions, reliability parameters calculation including Markovski model. Fault tolerant systems and its particular realization. Test reliability. The transition from the reliability to the quality, principes QPL and QML. Code fundamental conceptions, linear code and cyclic code.

Povinná literatura

Parker K. P.: The Boundary-scan handbook; Kluwer 2003; ISBN 1-4020-7496-4
Crouch A. L.: Design for test, For digital IC'sand embedded core systems; Prentice Hall 1999; ISBN 0-13-0848-27-1
Abramovici M., Breuer M. A. and Friedman A. D.: Digital System Testing and Testable Design. IEEE PRESS 1990; ISBN 0-7803-1062-4 
Bleeker H., Eijnden P. and Jong F.: Boundary-Scan Test, A practical Approach; Kluwer Academic Publishers 1993; ISBN 0-7923-9296-5
Reed I. S. and Xuemin Chen: Error-control coding for data networks; Kluwer 1999; ISBN 978-0-7923-8528-8 

Doporučená literatura

Pradham and etc.:Fault-Tolerant Computing, Theory and Techniques, Volume I; Prentice Hall 1986; ISBN 0-13-308-230-X
Pradham and etc.:Fault-Tolerant Computing, Theory and Techniques, Volume II; Prentice Hall 1986; ISBN 0-13-308-222-9


zpět na vyhledávání
Language of instruction čeština
Code 454-0310
Abbreviation SaD
Course title Reliability and Diagnostics
Coordinating department Department of Telecommunications
Course coordinator doc. Ing. Jaroslav Zdrálek, Ph.D.