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Ukončeno v akademickém roce 2015/2016

Advanced Technologies of Nanostructures Preparation - Principles and Applications

Type of study Follow-up Master
Language of instruction English
Code 516-0079/02
Abbreviation PTN
Course title Advanced Technologies of Nanostructures Preparation - Principles and Applications
Credits 4
Coordinating department Institute of Physics
Course coordinator Mgr. Jaroslav Hamrle, Ph.D.

Osnova předmětu

Content focus:
- Introduction to physical technologies. Description and overview of selected
physical technologies. The use of physical technologies.
- Principles of physical technologies, technological and analytical equipment.
Principles of growth layers. Interaction of particles with matter (electrons, ions, neutral
particles photons). Electron beam sources, parameters and calculation of electron sources.
Ion sources, parameters and calculation of ion sources. Electron and
ion optical systems. Sources of atoms and molecules, parameters and calculation
ion sources. Plasma as a source of chemically active particles. Source photons
optical systems.
- Physical technologies. Deposition of thin films and coatings,
nanostructures (evaporation, MBE, CVD, PECVD, magnetron and ion sputtering,
direct ion deposition, laser ablation, etc.). Alloy (diffusion, ion
implantation). Lithography. Etching of surfaces, thin films and coatings
(chemical etching, plasma etching and ion).
- Analysis of surfaces, thin films and nanostructures - overview. use
individual methods (STM, AFM, TEM, SEM, AES, RBS, ISS, SIMS, XPS, LEED, RHEED,
etc.). New trends in advanced materials technologies.

Povinná literatura

BRODIE, I., MURAY, J. J.: The Physics of Micro/Nano-Fabrication, Plenum
Press, New York, 1992;
VÁLYI, L.: Atom and Ion Sources, John Wiley and Sons Ltd (March 1, 1978);
ECKERTOVÁ, L.: Physics of Thin Films, Plenum Press, New York, 1986;
FELDMAN, L. C., MAYER, J. W.: Fundamentals of Surface and Thin Film Analysis,
Elsevier Science Publishing Co., Inc., 1986;
RIVIERE, J. C.: Surface Analytical Techniques, Clarendon Press, Oxford, 1990.

Doporučená literatura

BRODIE, I., MURAY, J. J.: The Physics of Micro/Nano-Fabrication, Plenum
Press, New York, 1992;
VÁLYI, L.: Atom and Ion Sources, John Wiley and Sons Ltd (March 1, 1978);
ECKERTOVÁ, L.: Physics of Thin Films, Plenum Press, New York, 1986;
FELDMAN, L. C., MAYER, J. W.: Fundamentals of Surface and Thin Film Analysis,
Elsevier Science Publishing Co., Inc., 1986;
RIVIERE, J. C.: Surface Analytical Techniques, Clarendon Press, Oxford, 1990.