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Terminated in academic year 2009/2010
Optical Spectroscopy and Ellipsometry
| Type of study | Doctoral |
|---|---|
| Language of instruction | Czech |
| Code | 516-0943/01 |
| Abbreviation | OSE |
| Course title | Optical Spectroscopy and Ellipsometry |
| Credits | 0 |
| Coordinating department | Institute of Physics |
| Course coordinator | doc. Dr. Mgr. Kamil Postava |
Subject syllabus
Literature
1. S. Svanberg, Atomic and molecular spectroscopy: basic aspects and
practical applications, Springer-Verlag, Berlin 1991.
2. D. S. Kliger, J. W. Lewis, C. E. Randall, Polarized light in optics and
spectroscopy, Academic Press, New York 1990.
3. R. M. A. Azzam, N. M. Bashara, Ellipsometry and polarized light, North-
Holland, Amsterdam 1977.
practical applications, Springer-Verlag, Berlin 1991.
2. D. S. Kliger, J. W. Lewis, C. E. Randall, Polarized light in optics and
spectroscopy, Academic Press, New York 1990.
3. R. M. A. Azzam, N. M. Bashara, Ellipsometry and polarized light, North-
Holland, Amsterdam 1977.
Advised literature
1. I. Ohlídal, D. Franta, Ellipsometry of thin film systems, In: Progress in
Optics, Vol. 41, Ed. E. Wolf, 2000.
2. H. Tompkins and E. Irene, Handbook of Ellipsometry, William Andrew 2005.
1. Proceedings from ICSE conferences: Thin Solid Films Vol. 234 (1993),
Vol. 290-291 (1996), Vol. 455-456 (2004)
Optics, Vol. 41, Ed. E. Wolf, 2000.
2. H. Tompkins and E. Irene, Handbook of Ellipsometry, William Andrew 2005.
1. Proceedings from ICSE conferences: Thin Solid Films Vol. 234 (1993),
Vol. 290-291 (1996), Vol. 455-456 (2004)