1. Physical principles of optical spectroscopy and ellipsometry
- Electron transitions and the origin of the spectral dependences of the optical parameters
- Modeling of dielectric function of materials
- Kramers-Kronig dispersion relation, the relation of absorption and dispersion
- Spectral device (dispersive prism, grating, Fabry-Perot
interferometer)
- Selected parts of optical thin films
- Methods of effective environments and their use in optical spectroscopy
2. REFLECTION AND TRANSMISSION spectroscopy in the visible, near-ultraviolet
A near-infrared
- Components of spectrometers, the two-spectrometer
- Materials used in optical spectroscopy
- Resolution limit and instrumentation functions monochromator
- Superstructure instruments for measuring reflection spectra, integrating sphere
3. Spectroscopic ellipsometry
- Methods of ellipsometry, the ellipsometric measurement angles psi and delta, generalized
ellipsometry
- Type ellipsometer (zero ellipsometry, polarization modulation,
rotating analyzer and rotating compensator)
- Methods of averaging and error compensation
- Methods of ellipsometric data
4. Spectroscopy in the mid-infrared
- The physical origin of the infrared absorption spectrum characteristic vibrational
- The principle of using a Fourier transform spectrometer (FTIR)
- Modeling of the absorption maxima, chemical analysis
5. Magneto-optical spectroscopy
- The origin of magneto-optical phenomena, Kerr, Faraday and magneto Voightův
phenomenon
- Cutting magneto phenomena according to the direction of magnetization
- Specifics of magneto-optical ellipsometer
6. MODERN AND ADDITIONAL GUIDELINES optical spectroscopy
- Emission spectroscopy
- Laser spectroscopy, photoluminescence and fluorescence spectroscopy,
Raman spectroscopy
- Spectroscopy with a time resolution
- Spectral measurements on ultrathin layers
- Periodic diffraction grating systems
7. APPLICATION optical spectroscopy and ellipsometry IN RESEARCH
A TECHNOLOGICAL PRACTICE
- Electron transitions and the origin of the spectral dependences of the optical parameters
- Modeling of dielectric function of materials
- Kramers-Kronig dispersion relation, the relation of absorption and dispersion
- Spectral device (dispersive prism, grating, Fabry-Perot
interferometer)
- Selected parts of optical thin films
- Methods of effective environments and their use in optical spectroscopy
2. REFLECTION AND TRANSMISSION spectroscopy in the visible, near-ultraviolet
A near-infrared
- Components of spectrometers, the two-spectrometer
- Materials used in optical spectroscopy
- Resolution limit and instrumentation functions monochromator
- Superstructure instruments for measuring reflection spectra, integrating sphere
3. Spectroscopic ellipsometry
- Methods of ellipsometry, the ellipsometric measurement angles psi and delta, generalized
ellipsometry
- Type ellipsometer (zero ellipsometry, polarization modulation,
rotating analyzer and rotating compensator)
- Methods of averaging and error compensation
- Methods of ellipsometric data
4. Spectroscopy in the mid-infrared
- The physical origin of the infrared absorption spectrum characteristic vibrational
- The principle of using a Fourier transform spectrometer (FTIR)
- Modeling of the absorption maxima, chemical analysis
5. Magneto-optical spectroscopy
- The origin of magneto-optical phenomena, Kerr, Faraday and magneto Voightův
phenomenon
- Cutting magneto phenomena according to the direction of magnetization
- Specifics of magneto-optical ellipsometer
6. MODERN AND ADDITIONAL GUIDELINES optical spectroscopy
- Emission spectroscopy
- Laser spectroscopy, photoluminescence and fluorescence spectroscopy,
Raman spectroscopy
- Spectroscopy with a time resolution
- Spectral measurements on ultrathin layers
- Periodic diffraction grating systems
7. APPLICATION optical spectroscopy and ellipsometry IN RESEARCH
A TECHNOLOGICAL PRACTICE