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Measurement of Topography of Surfaces Created by Various Technological Processes

Summary

The main aim of the course is to provide a basic idea of measuring the topography of surface created by various technological processes. Understanding the principles of measuring the surface topography will enable the rational use of all possibilities of application of instruments and devices developed for studying the surface topography. Knowledge of the influence of technological process on the surface topography is very important to production increase at keeping the required quality of products, which is the goal of each technology. The course focuses on surface generation, its importance in various technologies, evaluation of surface topography, surface topography check by various methods (mechanical, optical, and others), and concentrates on contactless methods of surface topography detection.

Literature

BECKMANN, P., SPIZZICHINO, A. The Scattering of Electromagnetic waves
from Rough Surfaces. Oxford : Pergamon, 1963, 503 s. ISBN 63-10-108.

Advised literature

OGILVY, J. A. Theory of waves scattering from random rough surfaces. Bristol,
IOP Publishing Ltd., 1992. 272 s. ISBN 0-7503-0063-9 .


Language of instruction čeština, čeština
Code 516-0947
Abbreviation MTP
Course title Measurement of Topography of Surfaces Created by Various Technological Processes
Coordinating department Institute of Physics
Course coordinator doc. Ing. Jan Valíček, Ph.D.