Principles of the diffraction of x-rays by solid state substances are
elucidated and pertinent experimental techniques as well as procedures for the
evaluation of diffraction patterns are described. The meaning of the reciprocal
lattice and the Ewald construction is explained. Formulae forthe calculation of
intensition, breadths and azimutal profiles of diffraction lines are derived.
Use of the x-ray diffraction for the identification of phase composition, phase
abundance analysis and determination of the particle size, stresses (of the
1st,2nd and 3rd kind) and preferred orientation is discussed.