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Techniques of Structure Characterization

Techniques of Structure Characterization
636-0407/01
čeština Techniques of Structure Characterization
636-0407/02
čeština

Summary

This course is dealing with basic principles, possibilities and limitations of
the most important experimental techniques for structure characterization of
technical materials. An attention is mainly paid to the following techniques:
optical microscopy, X ray diffraction and spectral analyses, transmission
electron microscopy, scanning electron microscopy, X ray microanalysis and
scanning probe microscopy techniques. Some examples of structure
characterization of advanced materials are presented.

Literature

WILLIAMS, D. B., C. B. CARTER. Transmission Electron Microscopy. A Textbook for Materials Science, Second Edition, New York: Springer-Verlag US, 2009. ISBN 978-0-387-76502-0 .
GOLDSTEIN, J., et al. Scanning electron microscopy and X – ray microanalysis, Third Edition, New York: Springer-Verlag US, 2003. ISBN 978-1-4613-4969-3 .

Advised literature

WHISTON, C. X-ray methods. Chichester: Wiley Blackwell, 1987. ISBN-13: 978-0471913863 .


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Language of instruction čeština, čeština
Code 636-0407
Abbreviation MSS
Course title Techniques of Structure Characterization
Coordinating department Department of Material Engineering
Course coordinator prof. Ing. Vlastimil Vodárek, CSc.