-Define principal aims of structural and phase analysis.
-Characterise fundamentals of image analysis.
-Compare possibilities and limitations of electron diffraction, neutron diffraction and X ray diffraction.
-Characterise basic principles of high resolution transmission electron microscopy.
-Outline possibilities of modern techniques in scanning electron microscopy.
-Compare possibilities and limitations of modern spectral analysis techniques.
-Characterise basic scanning probe microscopy techniques.
-Propose a procedure of structural analysis of a defective material.
-Characterise fundamentals of image analysis.
-Compare possibilities and limitations of electron diffraction, neutron diffraction and X ray diffraction.
-Characterise basic principles of high resolution transmission electron microscopy.
-Outline possibilities of modern techniques in scanning electron microscopy.
-Compare possibilities and limitations of modern spectral analysis techniques.
-Characterise basic scanning probe microscopy techniques.
-Propose a procedure of structural analysis of a defective material.