The subject is focused on methods of optical spectroscopies used for study of thin films and nanostructures periodic and composite materials. It is focused on physical principles, measurement methods, measured data processing, and specific aspects of surfaces, nanoparticles of periodic systems and effective media. The subject includes transmission and reflection spectroscopy, spectroscopic ellipsometry, infrared spectroscopy, and magneto-optical spectroscopic ellipsometry.
Povinná literatura
S. Svanberg, Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991
R. M. A. Azzam, N. M. Bashara, Ellipsometry and polarized light, North-Holland, Amsterdam 1977
H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications, John Wiley & Sons 2007
P. Griffiths, J. A. De Haseth, Fourier Transform Infrared Spectrometry (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications), Wiley 2nd. Ed, 2007
Doporučená literatura
O. Stenzel, The physics of thin film optical spectra, Springer 2005
P.Y. You and M. Cardona, Fundamentals of semiconductors, 3rd Ed, Springer 2010
I. Ohlídal, D. Franta, Ellipsometry of thin film systems, In: Progress in Optics, Vol. 41, Ed. E. Wolf, 2000
H. Tompkins and E. Irene, Handbook of Ellipsometry, William Andrew 2005
D. S. Kliger, J. W. Lewis, C. E. Randall, Polarized light in optics and spectroscopy, Academic Press, New York 1990