Characterization methods of nanostructures

Type of study	Doctoral
Language of instruction	Czech
Code	653-0953/03
Abbreviation	MCHN
Course title	Characterization methods of nanostructures
Credits	20
Coordinating department	Department of Materials Engineering and Recycling
Course coordinator	doc. Dr. Mgr. Kamil Postava

Subject syllabus

1. Electron microscopy of nanostructures (sample preparation, Scanning Electron Microscopy, Transmission Electron Microscopy, special methods of electron microscopy)
2. Scanning probe microscopy (Atomic Force Microscopy, Magnetic Force Microscopy, Scanning Near-field Optical Microscopy, Scanning Tunelling Microscopy)
3, Special methods of optical microscopy (principles of microscopic methods, confocal microscopy)
4. X-ray spectroscopy and diffraction (X-ray diffraction, X-ray Photoeelectron Spectroscopy, Energy Dispersive X-ray Spectroscopy)
5. Optical spectroscopy of nanostructures (ultraviolet, visible spektroscopy, photoluminiscence, Fourier Transform InfraRed spectroscopy, THz spectroscopy, Raman spektroscopy, Atomic Absorption Spectroscopy), Inductively Coupled Plasma Spectroscopy, Mass Spectrometry, Nuclear Magnetic Resonance
6. Thermal analysis (Differential Thermal Analysis, Differential Scanning Calorimetry, Thermogravimetric analysis, simultaneous TG/DTA/DSC)
7. Measurement of size and shape of nanoparticles, and surface porosity (Laser diffraction, chromatography, Dynamic Light Scattering)
8. Organic analysis for nanostructure characterization (size exclusion chromatography, supercritical fluid, gas, liquid chromatography, mass detectors in chromatography, electromigration methods)
9. Measurement of ultrafast dynamic processes using time-resolved characterization of nanostructures (pump-probe spectroscopy, specific aspects of ultrashort-pulsed-lasers application)

Literature

S. Myhra, J. C. Rivière, Characterization of Nanostructures, CRC Press 2016
D.Brabazon and A.Raffer, Advanced Characterization Techniques for Nanostructures, In: Emerging Nanotechnologies for Manufacturing, Edited by: W. Ahmed and M. J. Jackson, William Andrew Publ. 2009
A. L. Da Róz, M. Ferreira, O. N. Oliveira, Jr., Nanocharacterization Techniques, 2017
S. T. Raju, T, Ajesh Z. R. Kumar, Microscopy Methods in Nanomaterials Characterization, Elsevier 2017
R. Haight, J. B Hannon, Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization, World Scientific 2011
E. Lundanes, L. Reubsaet, T. Greibrokk, Chromatography, basic Principles, Sample Preparations and Related Methods, J. Wiley and Sons, 2014

Advised literature

B. Bhushan (Ed.), Scanning Probe Microscopy in Nanoscience and Nanotechnology, Sprnger 2010
B. Voigtländer, Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology), Springer 2015
S. Svanberg, Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991
P. Griffiths, J. A. De Haseth, Fourier Transform Infrared Spectrometry (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications), Wiley 2nd. Ed, 2007
N. Yao, Z. L. Wang, Handbook of Microscopy for Nanotechnology (Nanostructure Science and TX‐Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniquesechnology), Springer 2005
J. Guo, X‐Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques, Willey 2010
M. F. Vitha, Chromatography: Principles and Instrumentation, J. Wiley and Sons, 2017

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