The subject includes physical and chemical characterization methods for nanostructures, measurement principles, limits of different techniques, and specific applications. Focus of the subject will be chosen in agreement with specialization of the student and title of his thesis.
Literature
S. Myhra, J. C. Rivière, Characterization of Nanostructures, CRC Press 2016
D.Brabazon and A.Raffer, Advanced Characterization Techniques for Nanostructures, In: Emerging Nanotechnologies for Manufacturing, Edited by: W. Ahmed and M. J. Jackson, William Andrew Publ. 2009
A. L. Da Róz, M. Ferreira, O. N. Oliveira, Jr., Nanocharacterization Techniques, 2017
S. T. Raju, T, Ajesh Z. R. Kumar, Microscopy Methods in Nanomaterials Characterization, Elsevier 2017
R. Haight, J. B Hannon, Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization, World Scientific 2011
E. Lundanes, L. Reubsaet, T. Greibrokk, Chromatography, basic Principles, Sample Preparations and Related Methods, J. Wiley and Sons, 2014
Advised literature
B. Bhushan (Ed.), Scanning Probe Microscopy in Nanoscience and Nanotechnology, Sprnger 2010
B. Voigtländer, Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology), Springer 2015
S. Svanberg, Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991
P. Griffiths, J. A. De Haseth, Fourier Transform Infrared Spectrometry (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications), Wiley 2nd. Ed, 2007
N. Yao, Z. L. Wang, Handbook of Microscopy for Nanotechnology (Nanostructure Science and TX‐Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniquesechnology), Springer 2005
J. Guo, X‐Rays in Nanoscience: Spectroscopy, Spectromicroscopy, and Scattering Techniques, Willey 2010
M. F. Vitha, Chromatography: Principles and Instrumentation, J. Wiley and Sons, 2017