The main target of this subject is to understand fundamental principles of optical spectroscopy to characterize materials, thin films, nanostructured and periodic systems. Attention is devoted to methods and techniques of measurement, optical properties of materials, modeling of spectroscopic response and fitting of experimental spectroscopic data to a model. Applications of the spectroscopic methods in chemical analysis, characterization in material structure and properties are summarized.
Povinná literatura
HOLLAS, J. M., Modern Spectroscopy (4th ed.), John Willey & Sons, 2009.
FOX, M., Optical properties of solids, Oxford Univ. Press, 2003.
STENZEL, O., The physics of thin film optical spectra, Springer, Berlin, 2005.
PALIK, E. D., Handbook of optical constants of solids, Academic Press, New York, 1998.
Doporučená literatura
OHLÍDAL, I., FRANTA, D.: Ellipsometry of thin film systems, In: Progress in Optics, Vol. 41, Ed. E. Wolf, 2000.
ZVEZDIN, A. K., KOTOV, V. A.: Modern magnetooptics and magnetooptical materials, IOP, Bristol 1977.
HRING, M., The material science of thin films, Academic Press, 1992.
MACLEOD, H. A.: Thin-film optical filters, 2nd ed. Bristol, 1986.
YEH, P.: Optical waves in layered media, Willey, New York 1988.
LUTH, H., Solid surfaces, interfaces and thin films, Springer, Berlin 2001.
AZZAM, R. M. A., BASHARA, N. M.: Ellipsometry and polarized light, North-Holland, Amsterdam, 1977.
SVANBERG, S.: Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991.