The lectures consist:
Physical principles of spectroscopic ellipsometry - electronic transitions and origin of spectral dependence of optical parameters, Kramers-Kronig dispersion relations.
Modelling of light propagation in spectroscopic system, matrix formalisms.
Optical spectroscopy of nanostructures - effective medium methods and their applications to nanostructured, nanocomposites, and porous materials.
Components of spectrometers and ellipsometers - sources, detectors, dispersion components, polarization optics.
Methods of spectroscopic data processing and fitting.
Reflection and transmission spectroscopy in visible near ultraviolet and near infrared spectral range, spectroscopic ellipsometry, FTIR spectrometry in mid and far infrared range, magneto=optic spectral elleipsometry, modern and advanced methods in spectrometry.
Literature
FOX, M., Optical properties of solids, Oxford Univ. Press, 2003.
HOLLAS, J. M., Modern Spectroscopy (4th ed.), John Willey & Sons, 2009.
Advised literature
SVANBERG, S.: Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991;
STENZEL, O., The physics of thin film optical spectra, Springer, Berlin, 2005;
PALIK, E. D., Handbook of optical constants of solids, Academic Press, New York, 1998;
OHLÍDAL, I., FRANTA, D.: Ellipsometry of thin film systems, In: Progress in Optics, Vol. 41, Ed. E. Wolf, 2000;
ZVEZDIN, A. K., KOTOV, V. A.: Modern magnetooptics and magnetooptical materials, IOP, Bristol 1977;