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Terminated in academic year 2019/2020

Methods of structure and phase analysis of nanomaterials

Type of study Follow-up Master
Language of instruction Czech
Code 9360-0140/01
Abbreviation STRAN
Course title Methods of structure and phase analysis of nanomaterials
Credits 3
Coordinating department CNT - Nanotechnology Centre
Course coordinator doc. Mgr. Kateřina Mamulová Kutláková, Ph.D.

Subject syllabus

1. Introduction- history, basic terms (definition of crystal, lattice types, Miller's indexes, crystallographic systems, minimal symmetry rules, reciprocal lattice).
2. Point symmetry, stereographic projection.
3. Group theory, crystallographic group of symmetry, symbols.
4. Matrix representation of symmetry operations.
5. Space group of symmetry; symbols, graphical illustration.
6. Crystallochemistry, crystallization processes, types of structure defects, crystal structure and chemical bond.
7. X-ray; principle, formation, forms, properties, registration, interaction with matter.
8. Diffraction of X-rays; Laue and Bragg equations; structural factor F (hkl).
9. X-ray diffraction methods, classification based on Ewald's scheme, Laue, Debye Scherrer, powder methods.
10. Powder diffractometers, indexation of powder patterns records, focusing methods, practical applications of powder methods.
11. Single crystal techniques; Weissenberg and precession method, types of diffractometers, complete X-ray analysis of crystal compounds.

Literature

DE GRAEF, Marc a Michael E MCHENRY. Structure of materials: an introduction to crystallography, diffraction and symmetry. 2nd ed., fully rev. and updated. New York: Cambridge University Press, 2012. ISBN 978-1-107-00587-7.

CHUNG, Frank H a Deane Kingsley SMITH, ed. Industrial applications of X-ray diffraction. New York: Marcel Dekker, c2000. ISBN 0-8247-1992-1.

GIACOVAZZO, Carmelo. Fundamentals of crystallography. Oxford: Oxford University Press, c1992. ISBN 0-19-855579-2.

Advised literature

GLUSKER, Jenny Pickworth a Kenneth N TRUEBLOOD. Crystal structure analysis: a primer. 2nd ed. New York: Oxford University Press, 1985. ISBN 0-19-503531-3.