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Methods of structure and phase analysis of nanomaterials

Anotace

Crystallochemistry and structures in solids. Structures of crystallic, amorphous and mesomorphous phases. Modern methods of solid state characterisation. In materials research, the scientist has many analytical questions related to the crystalline constitution of material samples. X-ray diffraction is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use X-ray diffraction to analyze a wide range of materials, from powders and thin films to nanomaterials and solid objects.

Povinná literatura

DE GRAEF, Marc a Michael E MCHENRY. Structure of materials: an introduction to crystallography, diffraction and symmetry. 2nd ed., fully rev. and updated. New York: Cambridge University Press, 2012. ISBN 978-1-107-00587-7.

CHUNG, Frank H a Deane Kingsley SMITH, ed. Industrial applications of X-ray diffraction. New York: Marcel Dekker, c2000. ISBN 0-8247-1992-1.

GIACOVAZZO, Carmelo. Fundamentals of crystallography. Oxford: Oxford University Press, c1992. ISBN 0-19-855579-2.

Doporučená literatura

GLUSKER, Jenny Pickworth a Kenneth N TRUEBLOOD. Crystal structure analysis: a primer. 2nd ed. New York: Oxford University Press, 1985. ISBN 0-19-503531-3.


Language of instruction čeština, angličtina, čeština, angličtina
Code 9360-0140
Abbreviation STRAN
Course title Methods of structure and phase analysis of nanomaterials
Coordinating department CNT - Nanotechnology Centre
Course coordinator doc. Mgr. Kateřina Mamulová Kutláková, Ph.D.