Terminated in academic year 2019/2020

Scanning probe microscopy and electron microscopy

Type of study	Follow-up Master
Language of instruction	Czech
Code	9360-0143/02
Abbreviation	SPM+EM
Course title	Scanning probe microscopy and electron microscopy
Credits	3
Coordinating department	CNT - Nanotechnology Centre
Course coordinator	doc. Ing. Vladimír Tomášek, CSc.

Subject syllabus

- Interaction of electrons with matter
- Basic types of electron microscopes
- Function principle of transmition electron microscope
- Sample preparation for transmition electron microscopy
- Function principle of scanning electron microscope
- Analytical electron microscopes
- Interaction of ion beam with matter
- Theoretical background in the field of scanning probe microscopy
- Scanning tunneling microscopy
- Atomic force microscopy
- Other techniques of scanning probe microscopy

Literature

BONNELL, D. editor. Scanning Probe Microscopy and Spectroscopy, Theory, Techniques and Applications. Wiley-VCH, 2001.
YAO, Nan, WANG, Zhong Lin. Handbook of Microscopy for Nanotechnology. Springer US, 2005. .
WATT, I., M.: The Principles and Practice of Electron Microscopy. Cambridge University Press,1997.

Advised literature

WILLIAMS D. B. Practical Analytical Electron Microscopy in Materials Science. Verlag Chemie International, 1984.
KRATOŠOVÁ, Gabriela, Kateřina DĚDKOVÁ, Ivo VÁVRA a Fedor ČIAMPOR. Investigation of nanoparticles in biological objects by electron microscopy techniques. In: Intracellular Delivery II: Fundamentals and Applications (Eds: Aleš Prokop, Y. Iwasaki, A. Harada), Springer Verlag, 2014.

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