Scanning probe microscopy and electron microscopy

The content of the subject is focused on the methods of materials structure study and their chemical and phase composition by transmission and scanning electron microscopy and scanning probe microscopy methods. The subject extend actual knowledge of students and parcicularly focuse on applications in nanomaterials and nanotechnology sphere. Students will be acquainted with the above mentioned imaging methods, with the principles of obtaining and processing of relevant image recordings and instrumentation of individual microscopes. Theoretically, they will acquaint themselves with instrumentation, aids and procedures for correct preparation of samples. They will also learn about combined techniques and correlative microscopy, it means techniques that combine different types of imaging with analytical methods. All information will be provided to students in relation to nanotechnologies and examples and specific images of nanoparticles / nanomaterials and applications in nanosciences will be documented.