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Special Methods of Analytical Chemistry

Type of study Doctoral
Language of instruction Czech
Code 9360-0211/01
Abbreviation SMACH
Course title Special Methods of Analytical Chemistry
Credits 10
Coordinating department CNT - Nanotechnology Centre
Course coordinator doc. Ing. Vladimír Tomášek, CSc.

Subject syllabus

1. Spectral methods of analytical chemistry
Atomic emission spectrometry (excitation by spark, glow discharge, ICP), optical spectrometry, mass spectrometry
Atomic absorption spectrometry (flame and electro thermal atomization, gaseous hydrides method)
X-ray spectral analysis, X-ray fluorescence spectrometry (XRF), XRF with focused X-ray beam, total reflection method, grazing method
Electron spectroscopy (XPS, AES)
Molecular absorption analysis, UV/VIS spectrometry, infrared spectrometry, Raman spectrometry, Raman microscopy

2. Electrochemical methods.
Conductometry, conductometric titrations
Potentiometry, ion selective electrodes, potentiometric titration
Electrolytical methods, voltammetry (polarography), new voltammetric methods, coulometry
Electromigration separation methods, capillary electrophoresis, isotachophoresis

3. Analytical electron microscopy (AEM)
Basics of electron microscopy, interaction of electron beam with matter and basic components of electron microscopes
Transmition electron microscopy (TEM), scanning electron microscopy (SEM), scanning transmition electron microscopy (STEM)
X-ray spectral microanalysis, Auger electrons spectrometry
Electron energy loss spectrometry (EELS)
Focused ion beam (FIB), manipulation with sample in nano - scale

Literature

1. J. Kenkel, Analytical Chemistry for Technicians, Third Edition, CRC 2002.
2. R. Tertian, F. Claisse, Priciples of Quantitative X-Ray Fluorescence Analysis, Hayden & son Ltd, London 1982.

Advised literature

1. E. P. Bertin, Principles and Practice of X-Ray Spectrometric Analysis, Plenum Press, New York - London 1975.
2. D. B. Williams, Practical Analytical Electron Microscopy in Materials Science, Verlag chemie international, Florida - Basel 1984.
3. N. Yao, Z. L. Wang (Eds.), Handbook of microscopy for nanotechnology, Kluwer Acadenic Publishers, Boston 2005.