1. J. Kenkel, Analytical Chemistry for Technicians, Third Edition, CRC 2002.
2. R. Tertian, F. Claisse, Priciples of Quantitative X-Ray Fluorescence Analysis, Hayden & son Ltd, London 1982.
Special Methods of Analytical Chemistry
| Language of instruction | angličtina, čeština |
|---|---|
| Code | 9360-0211 |
| Abbreviation | SMACH |
| Course title | Special Methods of Analytical Chemistry |
| Coordinating department | CNT - Nanotechnology Centre |
| Course coordinator | doc. Ing. Vladimír Tomášek, CSc. |
Course aims
Students become more familiar with the methods of chemical analysis of materials with a focus on the analysis of nanomaterials. Attention will be paid to the chosen spectral methods. Methods of X-ray spectral analysis, electron spectroscopy and emission spectral analysis with glow discharge for the analysis of very thin layers will be discussed. There will also be introduced to methods of spectral analysis in combination with electron microscopes and Raman spectroscopy in combination with a microscope.
Literature
Advised literature
1. E. P. Bertin, Principles and Practice of X-Ray Spectrometric Analysis, Plenum Press, New York - London 1975.
2. D. B. Williams, Practical Analytical Electron Microscopy in Materials Science, Verlag chemie international, Florida - Basel 1984.
3. N. Yao, Z. L. Wang (Eds.), Handbook of microscopy for nanotechnology, Kluwer Acadenic Publishers, Boston 2005.
2. D. B. Williams, Practical Analytical Electron Microscopy in Materials Science, Verlag chemie international, Florida - Basel 1984.
3. N. Yao, Z. L. Wang (Eds.), Handbook of microscopy for nanotechnology, Kluwer Acadenic Publishers, Boston 2005.