The course focuses on methods for characterizing the texture, phase composition, and structure of nanomaterials. It also enables students to understand the importance of X-ray diffraction analysis for the study of nanomaterials. The introductory lectures will focus on methods for characterizing the texture parameters of compact and powder materials. The following subject will enable understanding the significance of the X-ray diffraction analysis for the characterization of the nanomaterials. The lectures are oriented on the description of the materials´ structure, and the terms connected to the symmetry of the crystal structures and crystallochemistry will be defined. The following part of the lectures will provide insight into the origin and the characteristics of the X-ray irradiation, its interactions with matter. Information about the X-ray diffraction techniques, the X-ray diffractometers construction, and the individual functional attachments will be part of the next block of the lectures. The application of the X-ray diffraction analysis for qualitative and quantitative phase analysis will be described. In the last block of the lectures, the utilization of the diffraction methods for the structural characterization of the nanomaterials will be described.