1. General terms from the mineralogy and crystallography. Crystal systems, Bravais lattices, direction indices, Miller indices of lattice planes.
2. Macroscopic symmetry of the crystals, space groups and the effect of their symmetry on the properties of the crystals.
3. Reciprocal lattice, construction, relations in the reciprocal space, Ewald sphere.
4. Real crystal structures. Isomorphy, polymorphy, polytypism, defects in the crystal structures.
5. Origination of the X-ray irradiation, X-ray sources. Interaction of the X-ray irradiation with matter, diffraction of X-rays on the crystal lattice, influence of the atom position on the diffraction pattern.
6. Overview of the X-ray diffraction techniques, methods of the single-crystal diffraction, studies of the powder and polycrystalline samples.
7. Construction of the X-ray diffractometers, setups.
8. Attachments (primary, secondary optics, sample holders, chambers, detectors).
9. X-ray diffraction pattern, the information inside the patterns.
10. Application of the diffraction methods. Qualitative and quantitative diffraction analysis, determination of the lattice parameters.
11. Determination of the crystallite size, study of the lattice strain. Utilization of the X-ray diffraction for the characterization of the textures.
12. X-ray diffraction at high temperatures and pressures.
13. Rietveld methods for the quantitative phase analysis.
14. Neutron diffraction experiments (neutron sources, diffraction experiment, examples of the neutron diffraction analysis). X-ray tomography, principle, practical utilization.
2. Macroscopic symmetry of the crystals, space groups and the effect of their symmetry on the properties of the crystals.
3. Reciprocal lattice, construction, relations in the reciprocal space, Ewald sphere.
4. Real crystal structures. Isomorphy, polymorphy, polytypism, defects in the crystal structures.
5. Origination of the X-ray irradiation, X-ray sources. Interaction of the X-ray irradiation with matter, diffraction of X-rays on the crystal lattice, influence of the atom position on the diffraction pattern.
6. Overview of the X-ray diffraction techniques, methods of the single-crystal diffraction, studies of the powder and polycrystalline samples.
7. Construction of the X-ray diffractometers, setups.
8. Attachments (primary, secondary optics, sample holders, chambers, detectors).
9. X-ray diffraction pattern, the information inside the patterns.
10. Application of the diffraction methods. Qualitative and quantitative diffraction analysis, determination of the lattice parameters.
11. Determination of the crystallite size, study of the lattice strain. Utilization of the X-ray diffraction for the characterization of the textures.
12. X-ray diffraction at high temperatures and pressures.
13. Rietveld methods for the quantitative phase analysis.
14. Neutron diffraction experiments (neutron sources, diffraction experiment, examples of the neutron diffraction analysis). X-ray tomography, principle, practical utilization.