1. Methods of texture analysis of solid and powder material surfaces. Profilometry, 3D microscopy.
2. Specific surface area of powder materials. Physical adsorption of gases. Isotherms. Pore size distribution. Mercury porosimetry.
3. Particle size. Sieve analysis, sedimentation methods, laser granulometry, DLS method.
4. General terms from mineralogy and crystallography. Crystal systems, Bravais lattices, direction indices, Miller indices of lattice planes.
5. Macroscopic symmetry of the crystals, space groups, and the effect of their symmetry on the properties of the crystals.
6. Real crystal structures. Isomorphy, polymorphy, polytypism, and defects in the crystal structures.
7. Origination of the X-ray irradiation, X-ray sources. Interaction of the X-ray irradiation with matter, diffraction of X-rays on the crystal lattice, and influence of the atom position on the diffraction pattern.
8. Overview of the X-ray diffraction techniques, methods of the single-crystal diffraction, studies of the powder and polycrystalline samples.
9. Construction of the X-ray diffractometers, setups.
10. Attachments (primary, secondary optics, sample holders, chambers, detectors).
11. X-ray diffraction pattern, the information inside the patterns.
12. Application of the diffraction methods. Qualitative and quantitative diffraction analysis, determination of the lattice parameters.
13. Rietveld methods for the quantitative phase analysis
14. Determination of the crystallite size, study of the lattice strain. Utilization of X-ray diffraction for the characterization of the textures.
2. Specific surface area of powder materials. Physical adsorption of gases. Isotherms. Pore size distribution. Mercury porosimetry.
3. Particle size. Sieve analysis, sedimentation methods, laser granulometry, DLS method.
4. General terms from mineralogy and crystallography. Crystal systems, Bravais lattices, direction indices, Miller indices of lattice planes.
5. Macroscopic symmetry of the crystals, space groups, and the effect of their symmetry on the properties of the crystals.
6. Real crystal structures. Isomorphy, polymorphy, polytypism, and defects in the crystal structures.
7. Origination of the X-ray irradiation, X-ray sources. Interaction of the X-ray irradiation with matter, diffraction of X-rays on the crystal lattice, and influence of the atom position on the diffraction pattern.
8. Overview of the X-ray diffraction techniques, methods of the single-crystal diffraction, studies of the powder and polycrystalline samples.
9. Construction of the X-ray diffractometers, setups.
10. Attachments (primary, secondary optics, sample holders, chambers, detectors).
11. X-ray diffraction pattern, the information inside the patterns.
12. Application of the diffraction methods. Qualitative and quantitative diffraction analysis, determination of the lattice parameters.
13. Rietveld methods for the quantitative phase analysis
14. Determination of the crystallite size, study of the lattice strain. Utilization of X-ray diffraction for the characterization of the textures.