| Course Unit Code | 480-2023/01 |
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| Number of ECTS Credits Allocated | 5 ECTS credits |
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| Type of Course Unit * | Compulsory |
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| Level of Course Unit * | First Cycle |
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| Year of Study * | First Year |
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| Semester when the Course Unit is delivered | Summer Semester |
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| Mode of Delivery | Face-to-face |
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| Language of Instruction | Czech |
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| Prerequisites and Co-Requisites | Course succeeds to compulsory courses of previous semester |
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| Name of Lecturer(s) | Personal ID | Name |
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| HLA58 | doc. Ing. Irena Hlaváčová, Ph.D. |
| Summary |
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| Subject Physical methods of materials analysis provides students with an overview of basic methods and tools used to analyze material properties. |
| Learning Outcomes of the Course Unit |
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| List the basic experimental methods used for analysis of materials, describe their principles and define, which properties of materials it is possible to determine using various procedures. |
| Course Contents |
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1. Introduction to Measurement Theory - Fundamentals of Metrology.
2. Electronic structure of substances. Electromagnetic radiation
3. Analytical methods based on the interaction of photons with substance I:
photoelectron spectroscopy.
4. Analytical methods based on the interaction of photons with substance II:
X-ray spectroscopy.
5. Analytical methods based on photon interaction with substance III:
defectoscopy and diffraction.
6. Analytical methods based on interaction of electrons with substance I:
electron microscopy (scanning, Auger)
7. Analytical methods based on interaction of electrons with substance II:
electron diffraction
8. Analytical methods based on interaction of electrons with substance III:
X-ray microanalysis, mass spectroscopy
9. Analytical method based on neutron interaction with substance: neutron diffraction.
10. Analytical methods based on the interaction of ions with the substance:
Spectroscopy of scattered, slow, secondary ions, Rutherford back scattering
11. Autoemission microscopy and spectroscopy
12. Nuclear resonance methods - NMR, Mössbauer spectroscopy.
13. Special experimental techniques (magnetic, optical, magnetooptic ...) |
| Recommended or Required Reading |
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| Required Reading: |
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ECKERTOVA L.: Physics of Thin Films, Plenum Publishing Co., New York, SNTL Praha, 1986
DANILATOS G.D.: Advances in Electronics and Electron Physics, 78 (1990), 102
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ECKERTOVÁ L., FRANK L.: Metody analýzy povrchů - elektronová mikroskopie a difrakce. Academia, 1996.
FRANK L., KRÁL J.: Metody analýzy povrchů - iontové, sondové a speciální metody. Academia, 2002.
ECKERTOVÁ L.: Experimentální metody fyziky pevných látek – metody analýzy povrchů. Univerzita Karlova, Praha, 1982.
en:
ECKERTOVA L.: Physics of Thin Films, Plenum Publishing Co., New York, SNTL Praha, 1986
DANILATOS G.D.: Advances in Electronics and Electron Physics, 78 (1990), 102 |
| Recommended Reading: |
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DOEHNE E., BOWER N.W.: Microscopy and Microanalysis, 2, (1997), 535-563
COWLEY J.M.: Diffraction Physics, N. Holland Publishing Co., Amsterdam 1979 |
AMBROS F.: Experimentální metody a technika, ČVUT, 1993.
BRZKOVSKÝ K.: Experimentální metody měření, ČVUT, 1993.
DVOŘÁK L.: Úvod do fyziky kondenzovaných látek, UP Olomouc, 1993.
GRICOVÁ M.: Metody analýzy materiálů, ČVUT Praha, 1988.
en
DOEHNE E., BOWER N.W.: Microscopy and Microanalysis, 2, (1997), 535-563
COWLEY J.M.: Diffraction Physics, N. Holland Publishing Co., Amsterdam 1979
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| Planned learning activities and teaching methods |
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| Lectures, Tutorials, Experimental work in labs, Project work |
| Assesment methods and criteria |
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| Task Title | Task Type | Maximum Number of Points
(Act. for Subtasks) | Minimum Number of Points for Task Passing |
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| Credit and Examination | Credit and Examination | 100 (100) | 51 |
| Credit | Credit | 30 | 16 |
| Examination | Examination | 70 | 21 |