Course Unit Code | 9360-0131/03 |
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Number of ECTS Credits Allocated | 5 ECTS credits |
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Type of Course Unit * | Compulsory |
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Level of Course Unit * | First Cycle |
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Year of Study * | Third Year |
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Semester when the Course Unit is delivered | Winter Semester |
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Mode of Delivery | Face-to-face |
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Language of Instruction | Czech |
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Prerequisites and Co-Requisites | Course succeeds to compulsory courses of previous semester |
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Name of Lecturer(s) | Personal ID | Name |
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| TOM24 | doc. Ing. Vladimír Tomášek, CSc. |
| PLA88 | prof. Ing. Daniela Plachá, Ph.D. |
| STE17 | Ing. Gabriela Kratošová, Ph.D. |
| VAC121 | Ing. Miroslav Vaculík, Ph.D. |
| MAM02 | doc. Mgr. Kateřina Mamulová Kutláková, Ph.D. |
| PEI0007 | Mgr. Pavlína Peikertová, Ph.D. |
Summary |
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The subject give fundamentals of transmition and scanning electron microscopy, scanning probe microscopy and X-ray diffraction methods. Students will be acquainted with application of the methods for structure, chemical and phase composition study of materials. Students will be also acquainted with some chosen methods of nanomaterials study (chromatography, electrophoresis, IR spectrometry, thermal analysis, NMR). |
Learning Outcomes of the Course Unit |
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The goal is to acquaint students with chemical methods and implements for structure a chemical composition study of nanomaterials. |
Course Contents |
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1. Introduction to chromatography, theoretical foundations. Overview of chromatographic methods, basic arrangement of chromatograph.
2. Gas chromatography. Basic apparatus construction, columns, detectors, evaluation of results, applications.
3. Liquid chromatography. Basic apparatus construction, columns, detectors, evaluation of results.
4. Electromigration methods, theoretical foundations. Electrophoresis, its use for analysis of organic compounds.
5. Introduction to electron microscopy, theoretical foundations, interaction of electron beam with sample.
6. Scanning and transmission electron microscopy. Construction of microscopes, their use in study of structure and chemical composition of materials.
7. Introduction to scanning probe microscopy, theoretical foundations. Interaction of mechanical probe with sample surface.
8.Atomic force microscopy (AFM) and scanning tunneling microscopy (STM). Apparatus construction, applications.
9. Introduction to diffraction methods, theoretical foundations, interaction of x-rays with crystal substances.
10. X-ray diffractometry, basic diffractometers construction. Use in study of crystal structure and phase composition of materials.
11. Thermal analysis, theoretical foundations. Thermogravimetry (TG), Difference thermal analysis (DTA), analytical use.
12. Introduction to infrared spectroscopy, theoretical foundations, interaction of infrared radiation with molecules. Construction of spectrometers, analytical use.
13. Raman spectroscopy, theoretical foundations. Apparatus construction, analytical use.
14. |
Recommended or Required Reading |
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Required Reading: |
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BONNELL, D. editor. Scanning Probe Microscopy and Spectroscopy, Theory, Techniques and Applications. Wiley-VCH, 2001.
YAO, Nan, WANG, Zhong Lin. Handbook of Microscopy for Nanotechnology. Springer US, 2005. ISBN 978-1-4020-8003-6. |
ČECH BARABASZOVÁ, Karla, Kateřina MAMULOVÁ KUTLÁKOVÁ, Sylva HOLEŠOVÁ, Michal RITZ a Gražyna SIMHA MARTYNKOVÁ. Vybrané instrumentální metody analýzy materiálů a nanomateriálů. Brno: CERM, 2012. ISBN 978-80-7204-810-6.
YAO, Nan, WANG, Zhong Lin. Handbook of Microscopy for Nanotechnology. Springer US, 2005. ISBN 978-1-4020-8003-6.
ŠTULÍK, Karel a kolektiv. Analytické separační metody. Praha: Karolinum, 2004. ISBN 80-246-0852-9. |
Recommended Reading: |
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WATT, I. M. The Principles and Practice of Electron Microscopy. Cambridge University Press. 1997.
KENKEL, John. Analytical Chemistry for Technicians. Boca Raton: CRC Press, 2013. ISBN 978-1-4398-8105-7.
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BONNELL, D. editor: Scanning Probe Microscopy and Spectroscopy, Theory, Techniques and Applications. Wiley-VCH, 2001.
JONŠTA, Zdeněk a Vlastimil VODÁREK. Strukturně fázová analýza II. Ostrava: Texty PGS VŠB-TU, 1999.
KRAUS, I. Struktura a vlastnosti krystalů. Praha: Academia, 1993.
KRAUS, I. Úvod do strukturní rentgenografie. Praha: Academia, 1985.
BLOSS, F. D.: Crystallography and Crystal Chemistry. Holt, Rinehart and Inc. Winston, 1971.
HULÍNSKÝ, Václav a Karel JUREK. Zkoumání látek elektronovým paprskem. Praha: SNTL, 1982.
YAO, N., WANG, Z., L. (editors). Handbook of Microscopy for Nanotechnology. Kluwer Academic Publishers, 2005.
WATT, I. M. The Principles and Practice of Electron Microscopy. Cambridge University Press, 1997.
VŮJTEK, Milan, Roman KUBÍNEK, Miroslav MAŠLÁŇ. Nanoskopie. Olomouc: Univerzita Palackého, 2012. ISBN 978-80-244-3102-4.
KUBÍNEK. Roman, Milan VŮJTEK a Miroslav MAŠLÁŇ. Mikroskopie skenující sondou. Olomouc: Univerzita Palackého, 20003. ISBN 80-244-0602-0. |
Planned learning activities and teaching methods |
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Lectures |
Assesment methods and criteria |
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Task Title | Task Type | Maximum Number of Points (Act. for Subtasks) | Minimum Number of Points for Task Passing |
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Examination | Examination | 100 | 51 |