| Course Unit Code | 651-3028/02 |
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| Number of ECTS Credits Allocated | 4 ECTS credits |
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| Type of Course Unit * | Optional |
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| Level of Course Unit * | Second Cycle |
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| Year of Study * | |
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| Semester when the Course Unit is delivered | Winter, Summer Semester |
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| Mode of Delivery | Face-to-face |
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| Language of Instruction | English |
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| Prerequisites and Co-Requisites | Course succeeds to compulsory courses of previous semester |
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| Name of Lecturer(s) | Personal ID | Name |
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| MAT27 | prof. Ing. Vlastimil Matějka, Ph.D. |
| Summary |
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| The course focuses on methods for characterizing the texture, phase composition, and structure of nanomaterials. It also enables students to understand the importance of X-ray diffraction analysis for the study of nanomaterials. The introductory lectures will focus on methods for characterizing the texture parameters of compact and powder materials. The following subject will enable understanding the significance of the X-ray diffraction analysis for the characterization of the nanomaterials. The lectures are oriented on the description of the materials´ structure, and the terms connected to the symmetry of the crystal structures and crystallochemistry will be defined. The following part of the lectures will provide insight into the origin and the characteristics of the X-ray irradiation, its interactions with matter. Information about the X-ray diffraction techniques, the X-ray diffractometers construction, and the individual functional attachments will be part of the next block of the lectures. The application of the X-ray diffraction analysis for qualitative and quantitative phase analysis will be described. In the last block of the lectures, the utilization of the diffraction methods for the structural characterization of the nanomaterials will be described. |
| Learning Outcomes of the Course Unit |
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| The aim of the course is to acquaint the students with the issues connected to the texture and structure of the nanomaterials. In the field of material texture, students will also gain knowledge of 3D microscopic techniques, the determination of specific surface area, and particle size. To study the structure of materials, students will learn about X-ray diffraction analysis. After completing this course, students will be able to design a suitable method for studying the texture of material surfaces and use X-ray diffraction analysis to characterize nanomaterials, perform their own diffraction experiments, and interpret the measured data. |
| Course Contents |
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1. Methods of texture analysis of solid and powder material surfaces. Profilometry, 3D microscopy.
2. Specific surface area of powder materials. Physical adsorption of gases. Isotherms. Pore size distribution. Mercury porosimetry.
3. Particle size. Sieve analysis, sedimentation methods, laser granulometry, DLS method.
4. General terms from mineralogy and crystallography. Crystal systems, Bravais lattices, direction indices, Miller indices of lattice planes.
5. Macroscopic symmetry of the crystals, space groups, and the effect of their symmetry on the properties of the crystals.
6. Real crystal structures. Isomorphy, polymorphy, polytypism, and defects in the crystal structures.
7. Origination of the X-ray irradiation, X-ray sources. Interaction of the X-ray irradiation with matter, diffraction of X-rays on the crystal lattice, and influence of the atom position on the diffraction pattern.
8. Overview of the X-ray diffraction techniques, methods of the single-crystal diffraction, studies of the powder and polycrystalline samples.
9. Construction of the X-ray diffractometers, setups.
10. Attachments (primary, secondary optics, sample holders, chambers, detectors).
11. X-ray diffraction pattern, the information inside the patterns.
12. Application of the diffraction methods. Qualitative and quantitative diffraction analysis, determination of the lattice parameters.
13. Rietveld methods for the quantitative phase analysis
14. Determination of the crystallite size, study of the lattice strain. Utilization of X-ray diffraction for the characterization of the textures.
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| Recommended or Required Reading |
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| Required Reading: |
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WASEDA, Yoshio, Eiichiro MATSUBARA a Kozo SHINODA. X-Ray Diffraction Crystallography. 1. Berlin: Springer-Verlag Berlin Heidelberg, 2011. ISBN 978-3-642-16635-8.
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KRAUS, Ivo. Úvod do strukturní rentgenografie. 1. Praha: Academia, 1985. ISBN 21-014-85.
VALVODA, Václav. Základy strukturní analýzy. 1. Praha: Karolinum, 1992. ISBN 80-200-0280-4.
WASEDA, Yoshio, Eiichiro MATSUBARA a Kozo SHINODA. X-Ray Diffraction Crystallography. 1. Berlin: Springer-Verlag Berlin Heidelberg, 2011. ISBN 978-3-642-16635-8. |
| Recommended Reading: |
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| SURYANARAYANA, C. a M. GRANT NORTON. X-Ray Diffraction A Practical Approach. 1. New York: Springer US, 1998. ISBN 978-0-306-45744-9. |
KRAUS, Ivo a Nikolaj GANEV. Technické aplikace difrakční analýzy. 1. Praha: Vydavatelství ČVUT, 2004. ISBN 80-010-3099-7.
ZAMARSKÝ, Vítězslav, Helena RACLAVSKÁ a Dalibor MATÝSEK. Mineralogie a krystalografie pro FMMI. Ostrava: VŠB - Technická univerzita, 2008. ISBN 978-80-248-1904-4.
SURYANARAYANA, C. a M. GRANT NORTON. X-Ray Diffraction A Practical Approach. 1. New York: Springer US, 1998. ISBN 978-0-306-45744-9. |
| Planned learning activities and teaching methods |
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| Lectures, Individual consultations, Experimental work in labs, Field trip |
| Assesment methods and criteria |
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| Tasks are not Defined |