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ECTS Course Overview



Spectroscopy of Nanostructures

* Exchange students do not have to consider this information when selecting suitable courses for an exchange stay.

Course Unit Code9360-0160/03
Number of ECTS Credits Allocated3 ECTS credits
Type of Course Unit *Optional
Level of Course Unit *Second Cycle
Year of Study *
Semester when the Course Unit is deliveredWinter Semester
Mode of DeliveryFace-to-face
Language of InstructionCzech, English
Prerequisites and Co-Requisites Course succeeds to compulsory courses of previous semester
Name of Lecturer(s)Personal IDName
POS40doc. Dr. Mgr. Kamil Postava
Summary
The main target of this subject is to understand fundamental principles of optical spectroscopy to characterize materials, thin films, nanostructured and periodic systems. Attention is devoted to methods and techniques of measurement, optical properties of materials, modeling of spectroscopic response and fitting of experimental spectroscopic data to a model. Applications of the spectroscopic methods in chemical analysis, characterization in material structure and properties are summarized.
Learning Outcomes of the Course Unit
The main target of this subject is to understand fundamental principles of optical spectroscopy to characterize materials, thin films, nanostructured and periodic systems. Attention is devoted to methods and techniques of measurement, optical properties of materials, modeling of spectroscopic response and fitting of experimental spectroscopic data to a model. Applications of the spectroscopic methods in chemical analysis, characterization in material structure and properties are summarized.
Course Contents
The subject deals with methods, physical description and appliications of optical spectroscopy. The lectures consists of:

1. Physical principles of optical spectroscopy, origin of spectral dependence of optical parameters, Kramers-Kronigovy relations and its application in spectroscopy.
2. Modeling of light propagation, reflection, transmission, and absorption spectra of materials, thin films, and nanostructures.
3. Dispersion elements, gratings, doispersion prism, interference methods in infrared spectroscopy, time-domain spectroscopy. Sources, detectors and materials used in spectrometers.
4. Spectroscopy in visible, near ultraviolet and near infrared spectral range (components of spectrometers, dual beam spectrometer, resolution).
5. Spectroscopic ellipsometry, ellipsometric angles, generalized and Mueller matrix ellipsometry, methods of data processing.
6. Spectroscopy in mid infrared spectral range (physical origin of infrared absorptions, vibration spectra, symmetry, Fourier transform infrared spectroscopy, apodization, ATR, IRRAS), Raman spektroscopy.
7. Magneto-optical spectroscopy (origin of magneto-optical effects, Kerr, Faraday, and Voight magneto=optic effects).
8. Origin of optical spectra from free charges, drude term, relation with electrical properties of materials. Debye model, absorption of polar liquids.
9. Model of damped harmonic oscillator, application for description of interband transitions and for vibration spectra in infrared spectroscopy.
10. Semiclasical theory of optical spectra of crystals, band structure, polycrystalline and amorphous materials, excitons.
11. Origin of infrared vibration and rotation spectra.
12. Models of nanostructured and nanokomposite materials. Application of effective medium theory, Maxwell-Garnet a Bruggeman formula. Description of periodic and aperiodic systems, plasmonics.
Recommended or Required Reading
Required Reading:
HOLLAS, J. M., Modern Spectroscopy (4th ed.), John Willey & Sons, 2009.
FOX, M., Optical properties of solids, Oxford Univ. Press, 2003.
STENZEL, O., The physics of thin film optical spectra, Springer, Berlin, 2005.
PALIK, E. D., Handbook of optical constants of solids, Academic Press, New York, 1998.
HOLLAS, J. M., Modern Spectroscopy (4th ed.), John Willey & Sons, 2009.
FOX, M., Optical properties of solids, Oxford Univ. Press, 2003.
STENZEL, O., The physics of thin film optical spectra, Springer, Berlin, 2005.
PALIK, E. D., Handbook of optical constants of solids, Academic Press, New York, 1998.
Recommended Reading:
OHLÍDAL, I., FRANTA, D.: Ellipsometry of thin film systems, In: Progress in Optics, Vol. 41, Ed. E. Wolf, 2000.
ZVEZDIN, A. K., KOTOV, V. A.: Modern magnetooptics and magnetooptical materials, IOP, Bristol 1977.
HRING, M., The material science of thin films, Academic Press, 1992.
MACLEOD, H. A.: Thin-film optical filters, 2nd ed. Bristol, 1986.
YEH, P.: Optical waves in layered media, Willey, New York 1988.
LUTH, H., Solid surfaces, interfaces and thin films, Springer, Berlin 2001.
AZZAM, R. M. A., BASHARA, N. M.: Ellipsometry and polarized light, North-Holland, Amsterdam, 1977.
SVANBERG, S.: Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991.
OHLÍDAL, I., FRANTA, D.: Ellipsometry of thin film systems, In: Progress in Optics, Vol. 41, Ed. E. Wolf, 2000.
ZVEZDIN, A. K., KOTOV, V. A.: Modern magnetooptics and magnetooptical materials, IOP, Bristol 1977.
HRING, M., The material science of thin films, Academic Press, 1992.
MACLEOD, H. A.: Thin-film optical filters, 2nd ed. Bristol, 1986.
YEH, P.: Optical waves in layered media, Willey, New York 1988.
ECKERTOVÁ, L.: Fyzika tenkých vrstev, Populární přednášky o fyzice, sv. 21..
KŘEPELKA, J.: Optika tenkých vrstev, UP Olomouc, 1993.
LUTH, H., Solid surfaces, interfaces and thin films, Springer, Berlin 2001.
AZZAM, R. M. A., BASHARA, N. M.: Ellipsometry and polarized light, North-Holland, Amsterdam, 1977.
SVANBERG, S.: Atomic and molecular spectroscopy: basic aspects and practical applications, Springer-Verlag, Berlin 1991.
Planned learning activities and teaching methods
Lectures
Assesment methods and criteria
Tasks are not Defined